학술논문
'학술논문'
에서 검색결과 32건 | 목록
1~10
Conference
2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :41.2.1-41.2.4 Dec, 2020
Conference
Brain, R.; Bisnik, N.; Chen, H.-P.; Neulinger, J.; Lindert, N.; Peach, J.; Rockford, L.; Wang, Y.; Zhang, K.
IEEE International Interconnect Technology Conference Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC), 2014 IEEE International. :299-302 May, 2014
Conference
Mahameed, R.; Abdelmoneum, M.; Duarte, D.; Taylor, G.; Choi, S.-J.; Brain, R.; Morrow, P.; Fischer, P.
2013 Transducers & Eurosensors XXVII: The 17th International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS & EUROSENSORS XXVII) Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS & EUROSENSORS XXVII), 2013 Transducers & Eurosensors XXVII: The 17th International Conference on. :734-737 Jun, 2013
Conference
Bai, P.; Auth, C.; Balakrishnan, S.; Bost, M.; Brain, R.; Chikarmane, V.; Heussner, R.; Hussein, M.; Hwang, J.; Ingerly, D.; James, R.; Jeong, J.; Kenyon, C.; Lee, E.; Lee, S.-H.; Lindert, N.; Liu, M.; Ma, Z.; Marieb, T.; Murthy, A.; Nagisetty, R.; Natarajan, S.; Neirynck, J.; Ott, A.; Parker, C.; Sebastian, J.; Shaheed, R.; Sivakumar, S.; Steigerwald, J.; Tyagi, S.; Weber, C.; Woolery, B.; Yeoh, A.; Zhang, K.; Bohr, M.
IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :657-660 2004
Conference
Proceedings of the IEEE 2003 International Interconnect Technology Conference (Cat. No.03TH8695) Interconnect technology Interconnect Technology Conference, 2003. Proceedings of the IEEE 2003 International. :33-35 2003
Conference
Proceedings of the IEEE 2002 International Interconnect Technology Conference (Cat. No.02EX519) Interconnect technology conference Interconnect Technology Conference, 2002. Proceedings of the IEEE 2002 International. :18-20 2002
Conference
Brain, R.; Agrawal, S.; Becher, D.; Bigwood, R.; Buehler, M.; Chikarmane, V.; Childs, M.; Choi, J.; Daviess, S.; Ganpule, C.; He, J.; Hentges, P.; Jin, I.; Klopcic, S.; Malyavantham, G.; McFadden, B.; Neulinger, J.; Neirynck, J.; Neirynck, Y.; Pelto, C.; Plekhanov, P.; Shusterman, Y.; Van, T.; Weiss, M.; Williams, S.; Xia, F.; Yashar, P.; Yeoh, A.
2009 IEEE International Interconnect Technology Conference Interconnect Technology Conference, 2009. IITC 2009. IEEE International. :249-251 Jun, 2009
Conference
Natarajan, S.; Armstrong, M.; Bost, M.; Brain, R.; Brazier, M.; Chang, C.-H.; Chikarmane, V.; Childs, M.; Deshpande, H.; Dev, K.; Ding, G.; Ghani, T.; Golonzka, O.; Han, W.; He, J.; Heussner, R.; James, R.; Jin, I.; Kenyon, C.; Klopcic, S.; Lee, S.-H.; Liu, M.; Lodha, S.; McFadden, B.; Murthy, A.; Neiberg, L.; Neirynck, J.; Packan, P.; Pae, S.; Parker, C.; Pelto, C.; Pipes, L.; Sebastian, J.; Seiple, J.; Sell, B.; Sivakumar, S.; Song, B.; Tone, K.; Troeger, T.; Weber, C.; Yang, M.; Yeoh, A.; Zhang, K.
2008 IEEE International Electron Devices Meeting Electron Devices Meeting, 2008. IEDM 2008. IEEE International. :1-3 Dec, 2008
Conference
Brain, R.; Baran, A.; Bisnik, N.; Chen, H.-P.; Choi, S.-J.; Chugh, A.; Fradkin, M.; Glassman, T.; Hamzaoglu, F.; Hoggan, E.; Jahan, R.; Jamil, M.; Jan, C.-H.; Jopling, J.; Kan, H.; Kasim, R.; Kirby, S.; Lahiri, S.; Lee, B.-C.; Lenski, D.; Limb, J.; Lindert, N.; Musorrafiti, M.; Neulinger, J.; Rockford, L.; Park, J.; Singh, K.; Staus, C.; Steigerwald, J.; Turkot, B.; Vandervoorn, P.; Venkatesan, R.; Wu, S.; Yeh, J.-Y.; Wang, Y.; Zhang, Z.; Zhang, K.
2013 Symposium on VLSI Technology VLSI Technology (VLSIT), 2013 Symposium on. :T16-T17 Jun, 2013
Conference
Jan, C.-H.; Bhattacharya, U.; Brain, R.; Choi, S.-J.; Curello, G.; Gupta, G.; Hafez, W.; Jang, M.; Kang, M.; Komeyli, K.; Leo, T.; Nidhi, N.; Pan, L.; Park, J.; Phoa, K.; Rahman, A.; Staus, C.; Tashiro, H.; Tsai, C.; Vandervoorn, P.; Yang, L.; Yeh, J.-Y.; Bai, P.
2012 International Electron Devices Meeting Electron Devices Meeting (IEDM), 2012 IEEE International. :3.1.1-3.1.4 Dec, 2012
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[AR] Brain, R.
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