학술논문
'학술논문'
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Conference
Shahidi, G.G.; Ajmera, A.; Assaderaghi, F.; Bolam, R.J.; Hovel, H.; Leobandung, E.; Rausch, W.; Sadana, D.; Schepis, D.; Wagner, L.F.; Wissel, L.; Wu, K.; Davari, B.
Proceedings of the IEEE 1999 Custom Integrated Circuits Conference (Cat. No.99CH36327) Custom integrated circuits Custom Integrated Circuits, 1999. Proceedings of the IEEE 1999. :339-346 1999
Conference
Schepis, D.J.; Assaderaghi, F.; Yee, D.S.; Rausch, W.; Bolam, R.J.; Ajmera, A.C.; Leobandung, E.; Kulkarni, S.B.; Flaker, R.; Sadana, D.; Hovel, H.J.; Kebede, T.; Schiller, C.; Wu, S.; Wagner, L.F.; Saccamango, M.J.; Ratanaphanyarat, S.; Kuang, J.B.; Hsieh, M.C.; Tallman, K.A.; Martino, R.M.; Fitzpatrick, D.; Badami, D.A.; Hakey, M.; Chu, S.F.; Davari, B.; Shahidi, G.G.
International Electron Devices Meeting. IEDM Technical Digest Electron Devices Electron Devices Meeting, 1997. IEDM '97. Technical Digest., International. :587-590 1997
Conference
Strong, A.W.; Stamper, A.K.; Bolam, R.J.; Furukawa, T.; Gow, C.J.; Gow, T.R.; Martin, D.W.; Mittl, S.W.; Nakos, J.S.; Pennington, S.L.
31st Annual Proceedings Reliability Physics 1993 Reliability Physics Symposium, 1993. 31st Annual Proceedings., International. :18-21 1993
Academic Journal
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 50(4):941-944 Apr, 2003
Conference
Shahidi, G.G.; Ajmera, A.; Assaderaghi, F.; Bolam, R.J.; Leobandung, E.; Rausch, W.; Sankus, D.; Schepis, D.; Wagner, L.F.; Kun Wu; Davari, B.
1999 IEEE International Solid-State Circuits Conference. Digest of Technical Papers. ISSCC. First Edition (Cat. No.99CH36278) Solid-state circuits Solid-State Circuits Conference, 1999. Digest of Technical Papers. ISSCC. 1999 IEEE International. :426-427 1999
Conference
Proceedings of 1994 VLSI Technology Symposium VLSI technology VLSI Technology, 1994. Digest of Technical Papers. 1994 Symposium on. :43-44 1994
Academic Journal
In: IBM Journal of Research and Development . (IBM Journal of Research and Development, May 1999, 43(3):393-406)
Conference
Schepis, D.J.; Assaderaghi, F.; Yee, D.S.; Rausch, W.; Bolam, R.J.; Ajmera, A.C.; Leobandung, E.; Kulkarni, S.B.; Flaker, R.; Sadana, D.; Hovel, H.J.; Kebede, T.; Schiller, C.; Wu, S.; Wagner, L.F.
In: Technical Digest - International Electron Devices Meeting, IEDM . (Technical Digest - International Electron Devices Meeting, IEDM, 1997, :587-590)
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[AR] Bolam, R.J.
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