학술논문
'학술논문'
에서 검색결과 115건 | 목록
1~10
Academic Journal
Gao, Z.; Hu, M.; Baert, R.; Chehab, B.; Swenton, J.; Malagi, S.; Huisken, J.; Goossens, K.; Marinissen, E.J.
IEEE Design & Test IEEE Des. Test Design & Test, IEEE. 41(2):56-64 Apr, 2024
Conference
Sisto, G.; Chehab, B.; Genneret, B.; Baert, R.; Chen, R.; Weckx, P.; Ryckaert, J.; Chou, R.; van Der Plas, G.; Beyne, E.; Milojevic, D.
2021 IEEE International Interconnect Technology Conference (IITC) Interconnect Technology Conference (IITC), 2021 IEEE International. :1-3 Jul, 2021
Conference
Na, M.H.; Jang, D.; Baert, R.; Sarkar, S.; Patli, S.; Zografos, O.; Chehab, B.; Spessot, A.; Sisto, G.; Schuddinck, P.; Mertens, H.; Oniki, Y.; Hellings, G.; Litta, E. Dentoni; Ryckaert, J.; Horiguchi, N.
2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2021 5th IEEE. :1-3 Apr, 2021
Academic Journal
Ciofi, I.; Roussel, P.J.; Baert, R.; Contino, A.; Gupta, A.; Croes, K.; Wilson, C.J.; Mocuta, D.; Tokei, Z.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 66(5):2339-2345 May, 2019
Conference
2018 IEEE International Interconnect Technology Conference (IITC) Interconnect Technology Conference (IITC), 2018 IEEE International. :67-69 Jun, 2018
Conference
Chen, R.; Weckx, P.; Salahuddin, S. M.; Kim, S.-W.; Sisto, G.; Van der Plas, G.; Stucchi, M.; Baert, R.; Debacker, P.; Na, M.H.; Ryckaert, J.; Milojevic, D.; Beyne, E.
2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :15.2.1-15.2.4 Dec, 2020
Conference
Tokei, Zs.; Vega, V.; Murdoch, G.; O'Toole, M.; Croes, K.; Baert, R.; Veen, M. Van der; Adelmann, C.; Soulie, J. P.; Boemmels, J.; Wilson, C.; Park, S. H.; Sankaran, K.; Pourtois, G.; Sweerts, J.; Paolillo, S.; Decoster, S.; Mao, M.; Lazzarino, F.; Versluijs, J.; Blanco, V.; Ercken, M.; Kesters, E.; Le, Q-T.; Holsteyns, F.; Heylen, N.; Teugels, L.; Devriendt, K.; Struyf, H.; Morin, P.; Jourdan, N.; Elshocht, S. Van; Ciofi, I.; Gupta, A.; Zahedmanesh, H.; Vanstreels, K.; Na, M. H.
2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :32.2.1-32.2.4 Dec, 2020
Conference
Vega-Gonzalez, V.; Puliyalil, H.; Versluijs, J.; Lesniewska, A.; Varela-Pereira, O.; Baert, R.; Paolillo, S.; Decoster, S.; Schleicher, F.; Montero, D.; Bekaert, J.; Kesters, E.; Le, Q. T.; Lorant, C.; Teugels, L.; Heylen, N.; Jourdan, N.; El-Mekki, Z.; van der Veen, M.; Ciofi, I.; Briggs, B.; Heijlen, J.; Dupas, L.; De-Wachter, B.; Vancoille, E.; Webers, T.; Vats, H.; Rynders, L.; Cupak, M.; Uk-Lee, J.; Drissi, Y.; Halipre, L.; Charley, A.-L.; Verdonck, P.; Witters, T.; Gompel, S. V.; Kimura, Y.; Demonie, I.; Lazzarino, F.; Ercken, M; Kim, R.; Trivkovic, D.; Croes, K.; Leray, P.; Jaysankar, M.; Wilson., C.; Muroch, G.; Tokei, Z.
2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :20.5.1-20.5.4 Dec, 2020
Conference
Vega-Gonzalez, V.; Wilson, C. J.; Briggs, B.; Decoster, S.; Versluijs, J.; Lesniewska, A.; Paolillo, S.; Baert, R.; Puliyalil, H.; Bekaert, J.; Kesters, E.; Le, Q. T.; Lorant, C.; Varela P., O.; Teugels, L.; Heylen, N.; El-Mekki, Z.; van der Veen, M.; Webers, T.; Vats, H.; Rynders, L.; Cupak, M.; Uk-Lee, J.; Drissi, Y.; Halipre, L.; Charley, A.-L.; Verdonck, P.; Witters, T.; Gompel, S. V.; Kimura, Y.; Jourdan, N.; Ciofi, I.; Gupta, A.; Contino, A.; Boccardi, G.; Lariviere, S.; Dupas, L.; De-Wachter, B.; Vancoille, E.; Lazzarino, F.; Ercken, M; Debacker, P.; Kim, R.; Trivkovic, D.; Croes, K.; Leray, P.; Dillemans, L.; Chen, Y.-F.; Tokei, Z.
2019 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2019 IEEE International. :19.3.1-19.3.4 Dec, 2019
Conference
Ryckaert, J.; Na, M. H.; Weckx, P.; Jang, D.; Schuddinck, P.; Chehab, B.; Patli, S.; Sarkar, S.; Zografos, O.; Baert, R.; Verkest, D.
2019 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2019 IEEE International. :29.4.1-29.4.4 Dec, 2019
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[AR] Baert, R.
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