학술논문
'학술논문'
에서 검색결과 53건 | 목록
1~10
Conference
Chung, Yun-Yan; Yun, Wei-Sheng; Chou, Bo-Jhih; Hsu, Chen-Feng; Yu, Shao-Ming; Arutchelvan, G.; Li, Ming-Yang; Lee, Tsung-En; Lin, Bo-Jiun; Li, Chen-Yi; Wei, Aslan; Sathaiya, D. Mahaveer; Chung, Cheng-Ting; Liew, San-Lin; Hou, Vincent D.-H.; Chang, Wen-Hao; Liu, Bo-Heng; Chen, Chien-Wei; Su, Chien-Ying; Kei, Chi-Chung; Cai, Jin; Wu, Chung-Cheng; Wu, Jeff; Lee, Tung-Ying; Chien, Chao-Hsin; Cheng, Chao-Ching; Radu, Iuliana P.
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Academic Journal
Rinaudo, P.; Chasin, A.; Franco, J.; Wu, Z.; Subhechha, S.; Arutchelvan, G.; Eneman, G.; Ramana, B.Y.V.; Rassoul, N.; Delhougne, R.; Kaczer, B.; De Wolf, I.; Kar, G.S.
IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 23(3):337-345 Sep, 2023
Academic Journal
Veloso, A.; Jourdain, A.; Radisic, D.; Chen, R.; Arutchelvan, G.; O'Sullivan, B.; Arimura, H.; Stucchi, M.; De Keersgieter, A.; Hosseini, M.; Hopf, T.; D'have, K.; Wang, S.; Dupuy, E.; Mannaert, G.; Vandersmissen, K.; Iacovo, S.; Marien, P.; Choudhury, S.; Schleicher, F.; Sebaai, F.; Oniki, Y.; Zhou, X.; Gupta, A.; Schram, T.; Briggs, B.; Lorant, C.; Rosseel, E.; Hikavyy, A.; Loo, R.; Geypen, J.; Batuk, D.; Martinez, G.T.; Soulie, J.P.; Devriendt, K.; Chan, B.T.; Demuynck, S.; Hiblot, G.; Van der Plas, G.; Ryckaert, J.; Beyer, G.; Litta, E.D.; Beyne, E.; Horiguchi, N.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(12):7173-7179 Dec, 2022
Academic Journal
Wu, W.-C.; Chien, C.-H.; Hung, T.Y.T.; Arutchelvan, G.; Hsu, C.-F.; Su, S.-K.; Chou, A.S.; Chen, E.; Lee, T.Y.; Philip Wong, H.-S.; Cheng, C.-C.; Radu, I.P.; Sathaiya, D.M.; Wu, C.-C.; Wu, J.; Shen, Y.-Y.; Chang, W.-H.; Liew, S.L.; Hou, V.; Cai, J.
In: IEEE Transactions on Electron Devices . (IEEE Transactions on Electron Devices, 1 December 2023, 70(12):6680-6686)
Academic Journal
Lin, H.C.D.; Asselberghs, I.; Vais, A.; Arutchelvan, G.; Delabie, A.; Heyns, M.; Mocuta, A.; Radu, I.; Thean, A.
In Microelectronic Engineering 1 November 2015 147:314-317
Academic Journal
Gupta, A.; Pedreira, O.V.; Arutchelvan, G.; Zahedmanesh, H.; Devriendt, K.; Mertens, H.; Tao, Z.; Ritzenthaler, R.; Wang, S.; Radisic, D.; Kenis, K.; Teugels, L.; Sebai, F.; Lorant, C.; Jourdan, N.; Chan, B.T.; Subramanian, S.; Schleicher, F.; Hopf, T.; Peter, A.P.; Rassoul, N.; Debruyn, H.; Demonie, I.; Siew, Y.K.; Chiarella, T.; Briggs, B.; Zhou, X.; Rosseel, E.; De Keersgieter, A.; Capogreco, E.; Litta, E.D.; Boccardi, G.; Baudot, S.; Mannaert, G.; Bontemps, N.; Sepulveda, A.; Mertens, S.; Kim, M.; Dupuy, E.; Vandersmissen, K.; Paolillo, S.; Yakimets, D.; Chehab, B.; Favia, P.; Drijbooms, C.; Cousserier, J.; Jaysankar, M.; Lazzarino, F.; Morin, P.; Altamirano, E.; Mitard, J.; Wilson, C.J.; Holsteyns, F.; Boemmels, J.; Demuynck, S.; Tokei, Z.; Horiguchi, N.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(12):5349-5354 Dec, 2020
Conference
Veloso, A.; Jourdain, A.; Hiblot, G.; Schleicher, F.; D'have, K.; Sebaai, F.; Radisic, D.; Loo, R.; Hopf, T.; De Keersgieter, A.; Arimura, H.; Eneman, G.; Favia, P.; Geypen, J.; Arutchelvan, G.; Chasin, A.; Jang, D.; Nyns, L.; Rosseel, E.; Hikavyy, A.; Mannaert, G.; Chan, B. T.; Devriendt, K.; Demuynck, S.; Plas, G. Van der; Ryckaert, J.; Beyer, G.; Litta, E. Dentoni; Beyne, E.; Horiguchi, N.
2021 Symposium on VLSI Technology VLSI Technology, 2021 Symposium on. :1-2 Jun, 2021
Academic Journal
Verreck, D.; Arutchelvan, G.; Lockhart De La Rosa, C.J.; Leonhardt, A.; Chiappe, D.; Lu, A.K.A.; Pourtois, G.; Matagne, P.; Heyns, M.M.; De Gendt, S.; Mocuta, A.; Radu, I.P.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 65(10):4635-4640 Oct, 2018
Conference
2017 International Conference on Communication and Signal Processing (ICCSP) Communication and Signal Processing (ICCSP), 2017 International Conference on. :0728-0732 Apr, 2017
Conference
Gupta, A.; Mertens, H.; Tao, Z.; Demuynck, S.; Bommels, J.; Arutchelvan, G.; Devriendt, K.; Pedreira, O. Varela; Ritzenthaler, R.; Wang, S.; Radisic, D.; Kenis, K.; Teugels, L.; Sebaai, F.; Lorant, C.; Jourdan, N.; Chan, B. T.; Zahedmanesh, H.; Subramanian, S.; Schleicher, F.; Hopf, T.; Peter, A.; Rassoul, N.; Debruyn, H.; Demonie, I.; Siew, Y.; Chiarella, T.; Briggs, B.; Zhou, D.; Rosseel, E.; De Keersgieter, A.; Capogreco, E.; Litta, E. Dentoni; Boccardi, G.; Baudot, S.; Mannaert, G.; Bontemps, N.; Sepulveda, A.; Mertens, S.; Kim, M. S.; Dupuy, E.; Vandersmissen, K.; Paolillo, S.; Yakimets, D.; Chehab, B.; Favia, P.; Drijbooms, C.; Cousserier, J.; Jaysankar, M.; Lazzarino, F.; Morin, P.; Sanchez, E.; Mitard, J.; Wilson, C.; Holsteyns, F.; Tokei, Z.; Horiguchi, N.
2020 IEEE Symposium on VLSI Technology VLSI Technology, 2020 IEEE Symposium on. :1-2 Jun, 2020
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[AR] Arutchelvan, G.
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