학술논문
'학술논문'
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Academic Journal
Liang, Jianhui; Zhang, Jiali; Johanns, Kurt; Rubin, Kurt; Johnson, Walt; Schelwald, Rayner; Gupta, Varun; Reichert, Jeff; Amster, Oskar; Cuénod, Blaise; Juttin, Rémy
In Thin Solid Films 15 January 2024 788
Academic Journal
In Microelectronics Reliability September 2017 76-77:214-217
Conference
2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2018 IEEE International Symposium on the. :1-5 Jul, 2018
Conference
2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2017 IEEE 24th International Symposium on the. :1-4 Jul, 2017
Conference
2016 IEEE MTT-S International Microwave Symposium (IMS) Microwave Symposium (IMS), 2016 IEEE MTT-S International. :1-3 May, 2016
Academic Journal
Periodical
Proceedings of SPIE; August 2014, Vol. 9173 Issue: 1 p917308-917308-8
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[AR] Amster, Oskar
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