부산대학교 도서관

Chaves, A.; Sousa, G. O.; Khaliji, K.; da Costa, D. R.; Farias, G. A.; Low, Tony

Djavid, N.; Khaliji, K.; Tabatabaei, S. M.; Pourfath, M.

IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 61(1):23-29 Jan, 2014

Khaliji, K.; Noei, M.; Tabatabaei, S. M.; Pourfath, M.; Fathipour, M.; Abdi, Y.

IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 60(8):2464-2470 Aug, 2013

Khaliji K; Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, Minnesota 55455, USA.; Martín-Moreno L; Instituto de Nanociencia y Materiales de Aragon (INMA), CSIC-Universidad de Zaragoza, Zaragoza 50009, Spain.; Departamento de Fisica de la Materia Condensada, Universidad de Zaragoza, Zaragoza 50009, Spain.; Avouris P; Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, Minnesota 55455, USA.; IBM T. J. Watson Research Center, Yorktown Heights, New York 10598, USA.; Oh SH; Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, Minnesota 55455, USA.; Low T; Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, Minnesota 55455, USA.

Publisher: American Physical Society Country of Publication: United States NLM ID: 0401141 Publication Model: Print Cited Medium: Internet ISSN: 1079-7114 (Electronic) Linking ISSN: 00319007 NLM ISO Abbreviation: Phys Rev Lett Subsets: PubMed not MEDLINE; MEDLINE

Huang T; School of Electronic Science and Engineering, Nanjing University, Nanjing, China.; Tu X; School of Electronic Science and Engineering, Nanjing University, Nanjing, China.; Shen C; School of electronic science and engineering, University of Electronic Science and Technology of China, Chengdu, China.; Zheng B; School of Electronic Science and Engineering, Nanjing University, Nanjing, China.; Wang J; School of Electronic Science and Engineering, Nanjing University, Nanjing, China.; Wang H; Beijing Computational Science Research Centre, Beijing, China.; Khaliji K; Department of Electrical & Computer Engineering, University of Minnesota, Minneapolis, MN, USA.; Park SH; Department of Electrical & Computer Engineering, University of Minnesota, Minneapolis, MN, USA.; Liu Z; Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang, China.; Yang T; Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang, China.; Zhang Z; Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang, China.; Shao L; Beijing Computational Science Research Centre, Beijing, China.; Li X; School of electronic science and engineering, University of Electronic Science and Technology of China, Chengdu, China. lxs@uestc.edu.cn.; Shenzhen Institute for Advanced Study, University of Electronic Science and Technology of China, Shenzhen, China. lxs@uestc.edu.cn.; Low T; Department of Electrical & Computer Engineering, University of Minnesota, Minneapolis, MN, USA. tlow@umn.edu.; Department of Physics, University of Minnesota, Minneapolis, MN, USA. tlow@umn.edu.; Shi Y; School of Electronic Science and Engineering, Nanjing University, Nanjing, China. yshi@nju.edu.cn.; Wang X; School of Electronic Science and Engineering, Nanjing University, Nanjing, China. xiaomu.wang@nju.edu.cn.

Publisher: Nature Publishing Group Country of Publication: England NLM ID: 0410462 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1476-4687 (Electronic) Linking ISSN: 00280836 NLM ISO Abbreviation: Nature Subsets: PubMed not MEDLINE; MEDLINE

Khaliji, K.; Low, T.; Stauber, T.

In: Physical Review B. (Physical Review B, September 2020, 102(12))

Khaliji, K.; Biswas, S.R.; Oh, S.-H.; Low, T.; Hu, H.; Yang, X.; Dai, Q.; Avouris, P.

In: Physical Review Applied. (Physical Review Applied, 22 January 2020, 13(1))

Hu, H.; Yang, X.; Guo, X.; Dai, Q.; Khaliji, K.; Biswas, S.R.; Low, T.; García de Abajo, F.J.; Sun, Z.

In: Nature Communications. (Nature Communications, 1 December 2019, 10(1))

Peng R; Department of Electrical and Computer Engineering, University of Minnesota , Minneapolis, Minnesota 55455, United States.; Khaliji K; Department of Electrical and Computer Engineering, University of Minnesota , Minneapolis, Minnesota 55455, United States.; Youngblood N; Department of Electrical and Computer Engineering, University of Minnesota , Minneapolis, Minnesota 55455, United States.; Grassi R; Department of Electrical and Computer Engineering, University of Minnesota , Minneapolis, Minnesota 55455, United States.; Low T; Department of Electrical and Computer Engineering, University of Minnesota , Minneapolis, Minnesota 55455, United States.; Li M; Department of Electrical and Computer Engineering, University of Minnesota , Minneapolis, Minnesota 55455, United States.

Publisher: American Chemical Society Country of Publication: United States NLM ID: 101088070 Publication Model: Print-Electronic Cited Medium: Internet ISSN: 1530-6992 (Electronic) Linking ISSN: 15306984 NLM ISO Abbreviation: Nano Lett Subsets: PubMed not MEDLINE

Lee, I.-H.; Mohr, D.A.; Khaliji, K.; Low, T.; Oh, S.-H.; Martin-Moreno, L.

In: ACS Photonics. (ACS Photonics, 20 June 2018, 5(6):2208-2216)