학술논문

EBSCO Discovery Service
발행년
-
(예 : 2010-2015)
'학술논문' 에서 검색결과 218건 | 목록 1~20
Report
Collaboration, DarkSide-20kAcerbi, F.Adhikari, P.Agnes, P.Ahmad, I.Albergo, S.Albuquerque, I. F.Alexander, T.Alton, A. K.Amaudruz, P.Angiolilli, M.Aprile, E.Corona, M. AtzoriAuty, D. J.Ave, M.Avetisov, I. C.Azzolini, O.Back, H. O.Balmforth, Z.Olmedo, A. BarradoBarrillon, P.Batignani, G.Bhowmick, P.Bloem, M.Blua, S.Bocci, V.Bonivento, W.Bottino, B.Boulay, M. G.Buchowicz, A.Bussino, S.Busto, J.Cadeddu, M.Cadoni, M.Calabrese, R.Camillo, V.Caminata, A.Canci, N.Caravati, M.Cárdenas-Montes, M.Cargioli, N.Carlini, M.Castellani, A.Castello, P.Cavalcante, P.Cebrian, S.Chashin, S.Chepurnov, A.Choudhary, S.Cifarelli, L.Cleveland, B.Coadou, Y.Cocco, V.Colaiuda, D.Vilda, E. CondeConsiglio, L.Corbett, J.Costa, B. S.Czubak, M.D'Aniello, M.D'Auria, S.Rolo, M. D. Da RochaDainty, A.Darbo, G.Davini, S.de Asmundis, R.De Cecco, S.Dellacasa, G.Derbin, A. V.Devoto, A.Di Capua, F.Di Noto, L.Di Stefano, P.Dias, L. K.Mairena, D. DíazDionisi, C.Dolganov, G.Dordei, F.Dronik, V.Dylon, F.Elersich, A.Ellingwood, E.Erjavec, T.Fearon, N.Diaz, M. FernandezFicorella, A.Fiorillo, G.Franchini, P.Franco, D.Gatti, H. FrandiniFrolov, E.Gabriele, F.Gahan, D.Galbiati, C.Galiński, G.Gallina, G.Gallus, G.Garbini, M.Abia, P. GarciaGawdzik, A.Gendotti, A.Giovanetti, G. K.Casanueva, V. GoicoecheaGola, A.Grandi, L.Grauso, G.di Cortona, G. GrilliGrobov, A.Gromov, M.Gulino, M.Hackett, B. R.Hallin, A. L.Hamer, A.Haranczyk, M.Harrop, B.Hessel, T.Hollingham, J.Horikawa, S.Hu, J.Hubaut, F.Huff, D.Hugues, T.Hungerford, E. V.Ianni, A.Ippolito, V.Jamil, A.Jillings, C.Keloth, R.Kemmerich, N.Kemp, A.Kimura, M.Klenin, A.Kondo, K.Korga, G.Kotsiopoulou, L.Koulosousas, S.Kubankin, A.Kunzé, P.Kuss, M.Kuźniak, M.Kuzwa, M.La Commara, M.Lai, M.Guirriec, E. LeLeason, E.Leoni, A.Lidey, L.Lipp, J.Lissia, M.Luzzi, L.Lychagina, O.Macfadyen, O.Machulin, I. N.Manecki, S.Manthos, I.Mapelli, L.Marasciulli, A.Mari, S. M.Mariani, C.Maricic, J.Martinez, M.Martoff, C. J.Matteucci, G.Mavrokoridis, K.McDonald, A. B.Merzi, S.Messina, A.Milincic, R.Minutoli, S.Mitra, A.Monroe, J.Moretti, E.Morrocchi, M.Morsy, A.Mroz, T.Muratova, V. N.Murra, M.Muscas, C.Musico, P.Nania, R.Nessi, M.Nieradka, G.Nikolopoulos, K.Nikoloudaki, E.Nikulin, I.Nowak, J.Olchanski, K.Oleinik, A.Oleynikov, V.Organtini, P.de Solórzano, A. OrtizPadmanabhan, A.Pallavicini, M.Pandola, L.Pantic, E.Paoloni, E.Papi, D.Park, B.Pastuszak, G.Paternoster, G.Peck, A.Pegoraro, P. A.Pelczar, K.Perez, R.Pesudo, V.Piacentini, S.Pino, N.Plante, G.Pocar, A.Pordes, S.Pralavorio, P.Preosti, E.Price, D.Puglia, S.Bazetto, M. QueirogaRaffaelli, F.Ragusa, F.Ramachers, Y.Ramirez, A.Ravinthiran, S.Razeti, M.Renshaw, A. L.Repond, A.Rescigno, M.Resconi, S.Retiere, F.Rignanese, L. P.Rivetti, A.Roberts, A.Roberts, C.Rogers, G.Romero, L.Rossi, M.Rubbia, A.Rudik, D.Runge, J.Sabia, M. A.Salomone, P.Samoylov, O.Sanfilippo, S.Santone, D.Santorelli, R.Santos, E. M.Sargeant, I.Savarese, C.Scapparone, E.Schuckman II, F. G.Scioli, G.Semenov, D. A.Shalamova, V.Sheshukov, A.Simeone, M.Skensved, P.Skorokhvatov, M. D.Smirnov, O.Smirnova, T.Smith, B.Spadoni, F.Spangenberg, M.Steri, A.Stornelli, V.Stracka, S.Sulis, S.Sung, A.Sunny, C.Suvorov, Y.Szelc, A. M.Taborda, O.Tartaglia, R.Taylor, A.Taylor, J.Testera, G.Thieme, K.Thompson, A.Torres-Lara, S.Tricomi, A.Unzhakov, E. V.Van Uffelen, M.Viant, T.Viel, S.Vishneva, A.Vogelaar, R. B.Vossebeld, J.Vyas, B.Wada, M.Walczak, M.Wang, H.Wang, Y.Westerdale, S.Williams, L.Wojcik, M.Wojcik, M. M.Xie, Y.Yang, C.Yin, J.Zabihi, A.Zakhary, P.Zani, A.Zhang, Y.Zhu, T.Zichichi, A.Zuzel, G.Zykova, M. P.
Conference
2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD) Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD), 2024 IEEE. :1-1 Oct, 2024
Conference
2024 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD) Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD), 2024 IEEE. :1-1 Oct, 2024
Academic Journal
IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 69(10):2188-2196 Oct, 2022
Report
Agnes, P.Ahmad, I.Albergo, S.Albuquerque, I. F. M.Alexander, T.Alton, A. K.Amaudruz, P.Corona, M. AtzoriAuty, D. J.Ave, M.Avetisov, I. Ch.Avetisov, R. I.Azzolini, O.Back, H. O.Balmforth, Z.Barbarian, V.Olmedo, A. BarradoBarrillon, P.Basco, A.Batignani, G.Berzin, E.Bondar, A.Bonivento, W. M.Borisova, E.Bottino, B.Boulay, M. G.Buccino, G.Bussino, S.Busto, J.Buzulutskov, A.Cadeddu, M.Cadoni, M.Caminata, A.Canci, N.Capra, A.Caprioli, S.Caravati, M.Cárdenas-Montes, M.Cargioli, N.Carlini, M.Castello, P.Cataudella, V.Cavalcante, P.Cavuoti, S.Cebrian, S.Ruiz, J. M. CelaChashin, S.Chepurnov, A.Chyhyrynets, ECicalò, C.Cifarelli, L.Cintas, D.Cocco, V.Vilda, E. CondeConsiglio, L.Copello, S.Covone, G.Cross, S.Czudak, P.D'Aniello, M.D'Auria, S.Rolo, M. D. Da RochaDadoun, O.Daniel, M.Davini, S.De Candia, A.De Cecco, S.De Falco, A.De Filippis, G.De Gruttola, D.De Pasquale, S.De Rosa, G.Dellacasa, G.Derbin, A. V.Devoto, A.Di Capua, F.Di Noto, L.Di Stefano, P.Dionisi, C.Dolganov, G.Dordei, F.Doria, L.Erjavec, T.Diaz, M. FernandezFiorillo, G.Franceschi, A.Franchini, P.Franco, D.Frolov, E.Funicello, N.Gabriele, F.Gahan, D.Galbiati, C.Gallina, G.Gallus, G.Garbini, M.Abia, P. GarciaGendotti, A.Ghiano, C.Giampaolo, R. A.Giganti, C.Giorgi, M. A.Giovanetti, G. K.Casanueva, V. GoicoecheaGola, A.Gorman, D.Diaz, R. GracianiGrauso, G.di Cortona, G. GrilliGrobov, A.Gromov, M.Guan, M.Guerzoni, M.Gulino, M.Guo, C.Hackett, B. R.Hall, J. B.Hallin, A. L.Hamer, A.Helton, H.Haranczyk, M.Hessel, T.Hill, S.Horikawa, S.Hubaut, F.Hugues, T.Hungerford, E. V.Ianni, An.Ippolito, V.Jillings, C.Kachru, P.Kemp, A. A.Kendziora, C. L.Keppel, G.Khomyakov, A. V.Kimura, M.Kochanek, I.Kondo, K.Korga, G.Koulosousas, S.Kubankin, A.Kuss, M.Kuźniak, M.La Commara, M.Lai, M.Guirriec, E. LeLeason, E.Li, X.Lidey, L.Lipp, J.Lissia, M.Longo, G.Luzzi, L.Macfadyen, O.Machulin, I. N.Manthos, I.Mapelli, L.Margotti, A.Mari, S. M.Mariani, C.Maricic, J.Marini, A.Martínez, M.Martoff, C. J.Masoni, A.Mavrokoridis, K.Mazzi, A.McDonald, A. B.Messina, A.Milincic, R.Moggi, A.Moharana, A.Monroe, J.Morrocchi, M.Mozhevitina, E. N.Mróz, T.Muratova, V. N.Muscas, C.Musico, P.Nania, R.Napolitano, T.Nessi, M.Nieradka, G.Nikolopoulos, K.Nikulin, I.Nowak, J.Olchansky, K.Oleinik, A.Oleynikov, V.Organtini, P.de Solórzano, A. OrtizPagani, L.Pallavicini, M.Pandola, L.Pantic, E.Paoloni, E.Paternoster, G.Pegoraro, P. A.Pelczar, K.Pellegrino, C.Perotti, F.Pesudo, V.Piacentini, S.Pietropaolo, F.Pino, N.Pira, C.Pocar, A.Poehlmann, D. M.Pordes, S.Pralavorio, P.Price, D.Raffaelli, F.Ragusa, F.Ramachers, Y.Ramirez, A.Razeti, M.Razeto, A.Renshaw, A. L.Rescigno, M.Resnati, F.Retiere, F.Rignanese, L. P.Ripoli, C.Rivetti, A.Roberts, A.Roberts, C.Rode, J.Rogers, G.Romero, L.Rossi, M.Rubbia, A.Sadashivajois, S.Saffold, T. R.Samoylov, O.Sandford, E.Sanfilippo, S.Santone, D.Santorelli, R.Savarese, C.Scapparone, E.Scioli, G.Semenov, D. A.Shchagin, A.Sheshukov, A.Simeone, M.Skensved, P.Skorokhvatov, M. D.Smirnov, O.Smirnova, T.Smith, B.Sokolov, A.Spangenberg, M.Stefanizzi, R.Steri, A.Stracka, S.Strickland, V.Stringer, M.Sulis, S.Sung, A.Suvorov, Y.Szelc, A. M.Türkoğ, C.Tartaglia, R.Taylor, A.Taylor, J.Tedesco, S.Testera, G.Thieme, K.Thorpe, T. N.Tonazzo, A.Torres-Lara, S.Tricomi, A.Unzhakov, E. V.John, T. VallivilayilVan Uffelen, M.Viant, T.Viel, S.Vishneva, A.Vogelaar, R. B.Vossebeld, J.Wada, M.Walczak, M. B.Wang, Y.Westerdale, S.Wheadon, R. J.Williams, L.Wingerter-Seez, I.Wojaczyński, R.Wojcik, Ma. M.Wojcik, Ma.Wright, T.Xie, Y.Yang, C.Zabihi, A.Zakhary, P.Zani, A.Zichichi, A.Zuzel, G.Zykova, M. P.
Phys. Rev. D 107, 112006 (2023)
Academic Journal
In: ACS Applied Materials and Interfaces. (ACS Applied Materials and Interfaces, 27 March 2024, 16(12):15084-15095)
Conference
In: Annual IEEE Semiconductor Thermal Measurement and Management Symposium, 41st Annual Semiconductor Thermal Measurement, Modeling and Management Symposium, SEMI-THERM 2025 - Proceedings. (Annual IEEE Semiconductor Thermal Measurement and Management Symposium, 2025, :123-126)
검색 결과 제한하기
제한된 항목
[AR] Lipp, J.
발행연도 제한
-
학술DB(Database Provider)
저널명(출판물, Title)
출판사(Publisher)
자료유형(Source Type)
주제어
언어