학술논문
'학술논문'
에서 검색결과 80건 | 목록
20~30
Conference
Ravsher, T.; Van Houdt, J.; Afanas'ev, V.; Fantini, A.; Trivedi, K.; Rassoul, N.; Dekkers, H.; Belmonte, A.; Wostyn, K.; Couet, S.; Kar, G.S.
In: 2024 IEEE International Memory Workshop, IMW 2024 - Proceedings , 2024 IEEE International Memory Workshop, IMW 2024 - Proceedings. (2024 IEEE International Memory Workshop, IMW 2024 - Proceedings, 2024)
Conference
Zhao, Y.; Rinaudo, P.; Chasin, A.; Truijen, B.; Kaczer, B.; Rassoul, N.; Dekkers, H.; Belmonte, A.; De Wolf, I.; Kar, G.; Franco, J.
In: IEEE International Reliability Physics Symposium Proceedings , 2024 IEEE International Reliability Physics Symposium, IRPS 2024 - Proceedings. (IEEE International Reliability Physics Symposium Proceedings, 2024)
Conference
Rinaudo, P.; Chasin, A.; Zhao, Y.; Kaczer, B.; Rassoul, N.; Dekkers, H.F.W.; Van Setten, M.J.; Belmonte, A.; De Wolf, I.; Kar, G.; Franco, J.
In: IEEE International Reliability Physics Symposium Proceedings , 2024 IEEE International Reliability Physics Symposium, IRPS 2024 - Proceedings. (IEEE International Reliability Physics Symposium Proceedings, 2024)
Academic Journal
Dekkers, H.F.W.; Van Setten, M.J.; Belmonte, A.; Chasin, A.V.; Subhechha, S.; Rassoul, N.; Glushkova, A.V.; Delhougne, R.; Kar, G.S.
In: ACS Applied Electronic Materials . (ACS Applied Electronic Materials, 22 March 2022, 4(3):1238-1249)
Conference
Vandooren, A.; Franco, J.; Parvais, B.; Wu, Z.; Witters, L.; Walke, A.; Li, W.; Peng, L.; Desphande, V.; Bufler, F.M.; Rassoul, N.; Hellings, G.; Jamieson, G.; Inoue, F.; Verbinnen, G.; Devriendt, K.; Teugels, L.; Heylen, N.; Vecchio, E.; Zheng, T.; Rosseel, E.; Vanherle, W.; Hikavyy, A.; Chan, B. T.; Ritzenthaler, R.; Besnard, G.; Schwarzenbach, W.; Gaudin, G.; Radu, I.; Nguyen, B.-Y.; Waldron, N.; Heyn, V. De; Mocuta, D.; Collaert, N.
2018 IEEE Symposium on VLSI Technology VLSI Technology, 2018 IEEE Symposium on. :69-70 Jun, 2018
Conference
Vandooren, A.; Franco, J.; Wu, Z.; Parvais, B.; Li, W.; Witters, L.; Walke, A.; Peng, L.; Deshpande, V.; Rassoul, N.; Hellings, G.; Jamieson, G.; Inoue, F.; Devriendt, K.; Teugels, L.; Heylen, N.; Vecchio, E.; Zheng, T.; Rosseel, E.; Vanherle, W.; Hikavyy, A.; Mannaert, G.; Chan, B. T.; Ritzenthaler, R.; Mitard, J.; Ragnarsson, L.; Waldron, N.; De Heyn, V.; Demuynck, S.; Boemmels, J.; Mocuta, D.; Ryckaert, J.; Collaert, N.
2018 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2018 IEEE International. :7.1.1-7.1.4 Dec, 2018
Academic Journal
van Setten, M.J.; Dekkers, H.F.W.; Kljucar, L.; Mitard, J.; Pashartis, C.; Subhechha, S.; Rassoul, N.; Delhougne, R.; Kar, G.S.; Pourtois, G.
In: ACS Applied Electronic Materials . (ACS Applied Electronic Materials, 28 September 2021, 3(9):4037-4046)
Periodical
Bannister, Julie; Mohanty, Nihar; Gupta, A.; Tao, Z.; Radisic, D.; Mertens, H.; Pedreira, O. Varela; Demuynck, S.; Bömmels, J.; Devriendt, K.; Heylen, N.; Wang, S.; Kenis, K.; Teugels, L.; Sebaai, F.; Lorant, C.; Jourdan, N.; Chan, B. T.; Subramanian, S.; Schleicher, F.; Peter, A.; Rassoul, N.; Siew, Y.; Briggs, B.; Zhou, D.; Rosseel, E.; Capogreco, E.; Mannaert, G.; Sepúlveda, A.; Dupuy, E.; Vandersmissen, K.; Chehab, B.; Murdoch, G.; Altamirano Sanchez, E.; Biesemans, S.; Tőkei, Zs.; Litta, E. Dentoni; Horiguchi, N.
Proceedings of SPIE; May 2022, Vol. 12056 Issue: 1 p120560B-120560B-5, 1085046p
Conference
Subhechha, S.; Cosemans, S.; Belmonte, A.; Rassoul, N.; Sharifi, S.H.; Debacker, P.; Verkest, D.; Delhougne, R.; Kar, G.S.
In: 2023 IEEE International Memory Workshop, IMW 2023 - Proceedings , 2023 IEEE International Memory Workshop, IMW 2023 - Proceedings. (2023 IEEE International Memory Workshop, IMW 2023 - Proceedings, 2023)
Conference
Thiam, N. A.; Wan, D.; Souriau, L.; Gavan, K. Babaei; Rassoul, N.; Swerts, J.; Couet, S.; Raymenants, E.; Jussot, J.; Trivkovic, D.; Ercken, M.; Wilson, C. J.; Radu, I. P.
Proceedings of SPIE; 1/21/2019, Vol. 10958, p1-14, 14p
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[AR] Rassoul, N.
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