학술논문
'학술논문'
에서 검색결과 266건 | 목록
10~20
Conference
2018 19th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2018 19th International Conference on. :1-7 Apr, 2018
Academic Journal
IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 68(8):2861-2870 Aug, 2019
Academic Journal
Perpina, X.; Vellvehi, M.; Werkhoven, R.J.; Jakovenko, J.; Kunen, J.M.G.; Bancken, P.; Bolt, P.J.; Jorda, X.
IEEE Transactions on Power Electronics IEEE Trans. Power Electron. Power Electronics, IEEE Transactions on. 34(4):3677-3688 Apr, 2019
Academic Journal
In Microelectronic Engineering 2010 87(11):2323-2327
Conference
2017 29th International Symposium on Power Semiconductor Devices and IC's (ISPSD) Power Semiconductor Devices and IC's (ISPSD), 2017 29th International Symposium on. :455-458 May, 2017
Conference
2017 Spanish Conference on Electron Devices (CDE) Electron Devices (CDE), 2017 Spanish Conference on. :1-4 Feb, 2017
Conference
Fernandez, M.; Perpina, X.; Vellvehi, M.; Sanchez, D.; Jorda, X.; Millan, J.; Cabeza, T.; Llorente, S.
2017 Spanish Conference on Electron Devices (CDE) Electron Devices (CDE), 2017 Spanish Conference on. :1-4 Feb, 2017
Conference
2017 Spanish Conference on Electron Devices (CDE) Electron Devices (CDE), 2017 Spanish Conference on. :1-4 Feb, 2017
Conference
2016 IEEE 21st International Mixed-Signal Testing Workshop (IMSTW) Mixed-Signal Testing Workshop (IMSTW), 2016 IEEE 21st International. :1-5 Jul, 2016
Academic Journal
In Microelectronics Reliability 2006 46(9):1834-1839
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[AR] Perpiñá, X.
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