학술논문
'학술논문'
에서 검색결과 40건 | 목록
10~20
Conference
Nourbakhsh, A.; Yu, L.; Sherwood, T.; Hung, P.Y.; Chen, X.; Krishnan, S.; Cepler, A.; Cheng, M.; Oren, Y.
In: ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings , 2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2022. (ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings, 2022, 2022-May)
Conference
In: ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings , 2021 32nd Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2021. (ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings, 10 May 2021, 2021-May)
Conference
Schmidt, D.; Durfee, C.; Pancharatnam, S.; Medikonda, M.; Greene, A.; Frougier, J.; Cepler, A.; Belkin, G.; Shafir, D.; Koret, R.; Shtainman, R.; Turovets, I.; Wolfling, S.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV. (Proceedings of SPIE - The International Society for Optical Engineering, 2021, 11611)
Conference
Schmidt, D.; Durfee, C.; Li, J.; Loubet, N.; Cepler, A.; Neeman, L.; Meir, N.; Ofek, J.; Oren, Y.; Fishman, D.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Semiconductor Manufacturing XXXV. (Proceedings of SPIE - The International Society for Optical Engineering, 2021, 11611)
Conference
Kong, D.; Schmidt, D.; Breton, M.; De La Pena, A.A.; Frougier, J.; Greene, A.; Zhang, J.; Basker, V.; Loubet, N.; Ahsan, I.; Cepler, A.; Klare, M.; Cheng, M.; Koret, R.; Turovets, I.
In: ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings , 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2020. (ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings, August 2020, 2020-August)
Academic Journal
In: Applied Physics Letters . (Applied Physics Letters, 2007, 90(20))
Conference
Adan, Ofer; Robinson, John C.; Schmidt, D.; Durfee, C.; Pancharatnam, S.; Medikonda, M.; Greene, A.; Frougier, J.; Cepler, A.; Belkin, G.; Shafir, D.; Koret, R.; Shtainman, R.; Turovets, I.; Wolfling, S.
Proceedings of SPIE; 11/4/2020, Vol. 11611, p116111U-116111U-11, 1p
Conference
Adan, Ofer; Robinson, John C.; Schmidt, D.; Durfee, C.; Li, J.; Loubet, N.; Cepler, A.; Neeman, L.; Meir, N.; Ofek, J.; Oren, Y.; Fishman, D.
Proceedings of SPIE; 11/4/2020, Vol. 11611, p116111T-116111T-12, 1p
Conference
Kagalwala, T.; Mahendrakar, S.; Vaid, A.; Isbester, P.K.; Cepler, A.; Kang, C.; Yellai, N.; Sendelbach, M.; Ko, M.; Ilgayev, O.; Katz, Y.; Tamam, L.; Osherov, I.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXXI. (Proceedings of SPIE - The International Society for Optical Engineering, 2017, 10145)
Conference
Muthinti, R.; Loubet, N.; Chao, R.; Ott, J.; Guillorn, M.; Felix, N.; Gaudiello, J.; Lund, P.; Cepler, A.; Sendelbach, M.; Cohen, O.; Wolfling, S.; Bozdog, C.; Klare, M.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXX. (Proceedings of SPIE - The International Society for Optical Engineering, 2016, 9778)
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제한된 항목
[AR] Cepler, A.
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