학술논문

Classification and recognition of soybean leaf diseases in Madhya Pradesh and Chhattisgarh using Deep learning methods
Document Type
Conference
Source
2023 2nd International Conference on Paradigm Shifts in Communications Embedded Systems, Machine Learning and Signal Processing (PCEMS) Paradigm Shifts in Communications Embedded Systems, Machine Learning and Signal Processing (PCEMS), 2023 2nd International Conference on. :1-6 Apr, 2023
Subject
Communication, Networking and Broadcast Technologies
Components, Circuits, Devices and Systems
Computing and Processing
Fields, Waves and Electromagnetics
Photonics and Electrooptics
Robotics and Control Systems
Signal Processing and Analysis
Deep learning
Training
Support vector machines
Microorganisms
Crops
Signal processing
Solids
Convolutional neural network (CNN)
Resnet V2
KNN
Soybean disease detection
Image processing.
Language
Abstract
Soybean is a major economic crop worldwide. So proper disease control measures must be implemented to reduce losses. These diseases can significantly affect the yield and quality of soybeans. Machine vision and pattern recognition technologies can help accurately diagnose crop diseases and minimize financial losses for soybean farmers. Many research papers discuss the use of deep learning algorithms for imagebased disease detection, including for soybean crops based on CNN, SVM, KNN, etc. However, lacking a well-curated dataset for soybean diseases is a challenge. Additionally, many existing research papers focus more on demonstrating the approach’s feasibility rather than providing solutions to the specific problems faced in a particular region. The proposed deep learning-based classification system for soybean leaf diseases can help identify Angular Leaf spots, Bacterial blight, Soybean Rust, and Downy mildew. An image dataset was created, and image-enhancing techniques were applied during pre-processing. The proposed classifier system achieved an efficiency of 83.9%, 93.01%, and 71.98% in classifying diseases using CNN, Resnet-V2, and KNN classifiers, respectively.