학술논문

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발행년	- (예 : 2010-2015)

전체선택

A device for localized measurement of small particles with electrode-integrated small pores

Academic Journal

Takeshiro, Y.; Usami, N.; Okamoto, Y.; Mita, Y.; Takada, T.; Washizu, N.; Higo, A.; Ikeno, R.; Asada, K.

In: IEEJ Transactions on Sensors and Micromachines. (IEEJ Transactions on Sensors and Micromachines, 2019, 139(8):271-276)

Scopus Find it@PNU

Fabrication of PbS QD/Silicon Hybrid Infrared Photodiode for LSI Platform

Academic Journal

Higo, A.; Mita, Y.; Usami, N.; Okamoto, Y.; Yamada, K.; Takeshiro, Y.; Wang, H.; Kubo, T.; Segawa, H.; Sugiyama, M.

In: IEEJ Transactions on Sensors and Micromachines. (IEEJ Transactions on Sensors and Micromachines, 2018, 138(7):307-311)

Scopus Find it@PNU

Mask-programmable on-chip photovoltaic cell array

Conference

Takeshiro, Y.; Okamoto, Y.; Mita, Y.

In: Journal of Physics: Conference Series, 17th International Conference on Micro and Nanotechnology for Power Generation and Energy Conversion Applications, PowerMEMS 2017. (Journal of Physics: Conference Series, 26 July 2018, 1052(1))

Full Text (ProQuest Central) Full Text (IOP Science) Full Text (IOP) Open Access (EBSCO) Open Access (IOP) Scopus Find it@PNU

Study on silicon device of microrobot system for heterogeneous integration

Conference

Saito, K.; Kaneko, M.; Uchikoba, F.; Contreras, D.S.; Pister, K.S.J.; Takeshiro, Y.; Okamoto, Y.; Mita, Y.; Nakata, Y.; Tanaka, T.; Kawamura, S.

In: 2018 International Conference on Electronics Packaging and iMAPS All Asia Conference, ICEP-IAAC 2018, 2018 International Conference on Electronics Packaging and iMAPS All Asia Conference, ICEP-IAAC 2018. (2018 International Conference on Electronics Packaging and iMAPS All Asia Conference, ICEP-IAAC 2018, 6 June 2018, :33-37)

Full Text (IEEE) Scopus Find it@PNU

Test structures for nano-gap fabrication process development for nano-electromechanical systems

Conference

Smith, S.; Ikeno, R.; Asada, K.; Takeshiro, Y.; Okamoto, Y.; Mita, Y.; Terry, J.G.; Walton, A.J.

In: IEEE International Conference on Microelectronic Test Structures, 2017 International Conference of Microelectronic Test Structures, ICMTS 2017. (IEEE International Conference on Microelectronic Test Structures, 20 June 2017)

Full Text (IEEE) Scopus Find it@PNU

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