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발행년	- (예 : 2010-2015)

The gender of PrEP: Transgender men negotiating legitimacy in France

Academic Journal

In: Social Science and Medicine. (Social Science and Medicine, May 2024, 348)

Full Text (ScienceDirect 종량제) Web of Science JCR 저널정보 Scopus Find it@PNU

Growth Optimization and Device Integration of Narrow-Bandgap Graphene Nanoribbons

Academic Journal

Borin Barin, G.; Sun, Q.; Di Giovannantonio, M.; Overbeck, J.; Perrin, M.L.; Urgel, J.I.; Mishra, S.; Kinikar, A.; Widmer, R.; Stolz, S.; Bommert, M.; Pignedoli, C.; Calame, M.; Fasel, R.; Ruffieux, P.; Du, C.-Z.; Wang, X.-Y.; Llinas, J.P.; Mutlu, Z.; Lin, Y.; Bokor, J.; Wilhelm, J.; Daniels, C.; Lamparski, M.; Meunier, V.; Sahabudeen, H.; Feng, X.; Müllen, K.; Narita, A.

In: Small. (Small, August 4, 2022, 18(31))

Full Text (Wiley Journals) Full Text (Wiley-DB) Web of Science JCR 저널정보 Scopus Find it@PNU

Interface engineering for enhanced electron mobilities in W/HfO/sub 2/ gate stacks

Conference

Callegari, A.; Jamison, P.; Carrier, E.; Zafar, S.; Gusev, E.; Narayanan, V.; D'Emic, C.; Lacey, D.; Feely, F.M.; Jammy, R.; Gribelyuk, M.; Shepard, J.; Andreoni, W.; Curioni, A.; Pignedoli, C.

IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :825-828 2004

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Electron mobility dependence on annealing temperature of W/HfO2 gate stacks: The role of the interfacial layer.

Academic Journal

Callegari, A.; Jamison, P.; Neumayer, D.; Feely, F. Mc.; Shepard, J.; Andreoni, W.; Curioni, A.; Pignedoli, C.

Journal of Applied Physics. 1/15/2006, Vol. 99 Issue 2, p023709. 5p. 5 Graphs.

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Tailoring low-dimensional organic semiconductor nanostructures

Academic Journal

Treier, M.; Nguyen, M.-T.; Richardson, N.V.; Pignedoli, C.; Passerone, D.; Fasel, R.

In: Nano Letters. (Nano Letters, January 2009, 9(1):126-131)

Full Text (ACS) Web of Science JCR 저널정보 Scopus Find it@PNU

Interface engineering for enhanced electron mobilities in W/HfO2 gate stacks.

Conference

Callegari, A.; Jamison, P.; Carrier, E.; Zafar, S.; Gusev, E.; Narayanan, V.; D'Emic, C.; Lacey, D.; Feely, F.M.; Jammy, R.; Gribelyuk, M.; Shepard, J.; Andreoni, W.; Curioni, A.; Pignedoli, C.

IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004; 2004, p825-828, 4p

Full Text (IEEE) Find it@PNU

Electron mobility dependence on annealing temperature of W/HfO 2 gate stacks: The role of the interfacial layer

Academic Journal

Callegari, A.; Jamison, P.; Neumayer, D.; Feely, F.Mc.; Shepard, J.; Andreoni, W.; Curioni, A.; Pignedoli, C.

In: Journal of Applied Physics. (Journal of Applied Physics, 15 January 2006, 99(2))

Full Text (AIP) Web of Science JCR 저널정보 Scopus Find it@PNU

First-principle simulations of molecular processes at semiconductor surfaces.

Academic Journal

Bertoni, C.; Felice, R.; Pignedoli, C.

Il Nuovo Cimento della Societa Italiana di Fisica: D; 1998, Vol. 20 Issue 7/8, p967-974, 8p

Scopus Find it@PNU

Electron mobility dependence on annealing temperature of W/HfO2 gate stacks: The role of the interfacial layer

Academic Journal

Callegeri, A.; Jamison, P.; Neumayer, D.; Feely, F.Mc.; Shepard, J.; Andreoni, W.; Curioni, A.; Pignedoli, C.

Journal of Applied Physics. Jan 15, 2006, Vol. 99 Issue 2, 023709-1-023709-5

Full Text (AIP) Web of Science JCR 저널정보 Scopus Find it@PNU

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