학술논문
'학술논문'
에서 검색결과 17건 | 목록
1~10
Conference
Tabery, C.; Capodieci, L.; Haidinyak, C.; Shah, K.; Threefoot, M.; Choo, B.; Singh, B.; Nehmadi, Y.; Ofek, C.; Menadeva, O.; Ben-Porath, A.
Proceedings of SPIE; Nov2005, Issue 1, p527-535, 9p
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Design for Manufacturability through Design-Process Integration III. (Proceedings of SPIE - The International Society for Optical Engineering, 2009, 7275)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXIII. (Proceedings of SPIE - The International Society for Optical Engineering, 2009, 7272)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Design for Manufacturability through Design-Process Integration III. (Proceedings of SPIE - The International Society for Optical Engineering, 2009, 7275)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Optical Microlithography XXI. (Proceedings of SPIE - The International Society for Optical Engineering, 2008, 6924)
Conference
Kramer, U.; Jackisch, D.; Wildfeuer, R.; Fuchs, S.; Jauzion-Graverolle, F.; Ben-Nahum, G.; Menadeva, O.; Ventola, S.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXII. (Proceedings of SPIE - The International Society for Optical Engineering, 2008, 6922)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXII. (Proceedings of SPIE - The International Society for Optical Engineering, 2008, 6922)
Conference
Shauly, E.; Drori, R.; Cohen-Yasour, M.; Rotstein, I.; Menadeva, O.; Peltinov, R.; Bartov, A.; Latinski, S.; Siany, A.; Geshesl, M.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXII. (Proceedings of SPIE - The International Society for Optical Engineering, 2008, 6922)
Conference
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXI. (Proceedings of SPIE - The International Society for Optical Engineering, 2007, 6518(PART 1))
Conference
Kramer, U.; Marschner, T.; Kaiser, D.; Winking, M.; Stief, C.; Ventola, S.; Lewitzki, D.; Abraham, Z.; Menadeva, O.; Shukrun, S.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XX. (Proceedings of SPIE - The International Society for Optical Engineering, 2006, 6152 I)
검색 결과 제한하기
제한된 항목
[AR] Menadeva, O.
발행연도 제한
-
학술DB(Database Provider)
저널명(출판물, Title)
출판사(Publisher)
자료유형(Source Type)
주제어
언어