학술논문
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1~10
Conference
2003 8th International Symposium Plasma- and Process-Induced Damage. Plasma- and process-induced damage Plasma- and Process-Induced Damage, 2003 8th International Symposium. :73-76 2003
Conference
2000 Semiconductor Manufacturing Technology Workshop (Cat. No.00EX406) Semiconductor manufacturing technology Semiconductor Manufacturing Technology Workshop, 2000. :133-139 2000
Conference
2000 5th International Symposium on Plasma Process-Induced Damage (IEEE Cat. No.00TH8479) Plasma process-induced damage Plasma Process-Induced Damage, 2000 5th International Symposium on. :54-56 2000
Conference
Fu-Liang Yang; Cheng-Chuan Huang; Chien-Chao Huang; Tang-Xuan Chung; Hou-Yu Chen; Chang-Yun Chang; Hung-Wei Chen; Di-Hong Lee; Sheng-Da Liu; Kuang-Hsin Chen; Cheng-Kuo Wen; Shui-Ming Cheng; Chang-Ta Yang; Li-Wei Kung; Chiu-Lien Lee; Yu-Jun Chou; Fu-Jye Liang; Lin-Hung Shiu; Jan-Wen You; King-Chang Shu; Bin-Chang Chang; Jaw-Jung Shin; Chun-Kuang Chen; Tsai-Sheng Gau; Ping-Wei Wang; Bor-Wen Chan; Peng-Fu Hsu; Jyu-Honig Shieh; Fung, S.K.-H.; Diaz, C.H.; Wu, C.-M.M.; Yee-Chaung See; Lin, B.J.; Liang, M.-S.; Sun, J.Y.-C.; Chenming Hu
Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004. VLSI technology VLSI Technology, 2004. Digest of Technical Papers. 2004 Symposium on. :8-9 2004
Conference
Fu-Liang Yang; Di-Hong Lee; Hou-Yu Chen; Chang-Yun Chang; Sheng-Da Liu; Cheng-Chuan Huang; Tang-Xuan Chung; Hung-Wei Chen; Chien-Chao Huang; Yi-Hsuan Liu; Chung-Cheng Wu; Chi-Chun Chen; Shih-Chang Chen; Ying-Tsung Chen; Ying-Ho Chen; Chih-Jian Chen; Bor-Wen Chan; Peng-Fu Hsu; Jyu-Horng Shieh; Han-Jan Tao; Yee-Chia Yeo; Yiming Li; Jam-Wem Lee; Pu Chen; Mong-Song Liang; Chenming Hu
Digest of Technical Papers. 2004 Symposium on VLSI Technology, 2004. VLSI technology VLSI Technology, 2004. Digest of Technical Papers. 2004 Symposium on. :196-197 2004
Conference
Fu-Liang Yang; Chien-Chao Huang; Hou-Yu Chen; Jhon-Jhy Liaw; Tang-Xuan Chung; Hung-Wei Chen; Chang-Yun Chang; Cheng Chuan Huang; Kuang-Hsin Chen; Di-Hong Lee; Hsun-Chih Tsao; Cheng-Kuo Wen; Shui-Ming Cheng; Yi-Ming Sheu; Ke-Wei Su; Chi-Chun Chen; Tze-Liang Lee; Shih-Chang Chen; Chih-Jian Chen; Cheng-hung Chang; Jhi-cheng Lu; Weng Chang; Chuan-Ping Hou; Ying-Ho Chen; Kuei-Shun Chen; Ming Lu; Li-Wei Kung; Yu-Jun Chou; Fu-Jye Liang; Jan-Wen You; King-Chang Shu; Bin-Chang Chang; Jaw-Jung Shin; Chun-Kuang Chen; Tsai-Sheng Gau; Bor-Wen Chan; Yi-Chun Huang; Han-Jan Tao; Jyh-Huei Chen; Yung-Shun Chen; Yee-Chia Yeo; Fung, S.K.-H.; Diaz, C.H.; Wu, C.-M.M.; Lin, B.J.; Liang, M.-S.; Sun, J.Y.-C.; Chenming Hu
IEEE International Electron Devices Meeting 2003 Electron devices IEDM'03 Electron Devices Meeting, 2003. IEDM '03 Technical Digest. IEEE International. :27.2.1-27.2.4 2003
Conference
In: International Symposium on Plasma Process-Induced Damage, P2ID, Proceedings . (International Symposium on Plasma Process-Induced Damage, P2ID, Proceedings, 2000, :54-56)
Academic Journal
Polymer International; Mar2004, Vol. 53 Issue 3, p320-325, 6p
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