학술논문

Epitaxy - a new technology for fabrication of advanced silicon radiation detectors

Document Type

Journal

Author

Kemmer, J; Wiest, F; Pahlke, A; Boslau, O; Goldstrass, P; Eggert, T; Schindler, M; Eisele, I

Source

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT; JUN 1 2005, 544 3, p612-p619, 8p.

Subject

Language

English

ISSN

01689002

Online Access

Full Text (ScienceDirect 종량제) Web of Science JCR 저널정보 Scopus Find it@PNU

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