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Investigation of Si/SiGe heterostructure material using non-destructive optical techniques

Document Type

Article

Author

Coonan, B.P ; Griffin, N; Beechinor, J.T; Murtagh, M; Redmond, G; Crean, G.M; Holländer, B; Mantl, S; Bozzo, S; Lazzari, J.-L; Arnaud d'Avitaya, F; Derrien, J; Paul, D.J

Source

In Thin Solid Films 27 March 2000 364(1-2):75-79

Subject

Language

ISSN

0040-6090

Online Access

Full Text (ScienceDirect) Web of Science JCR 저널정보 Scopus Find it@PNU

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