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Beam-test of CMOS pixel sensors with 6 GeV electrons

Document Type

Article

Author

Contarato, D.; Adamus, M.; Ciborowski, J.; Fretwurst, E.; Haas, T.; Hauschildt, J.; Klanner, R.; Kötz, U.; Löhr, B.; Muhl, C.; Polini, A.; Sztuk, J.; Tyszkiewicz, A.; Zeuner, W.

Source

In Nuclear Inst. and Methods in Physics Research, A 2006 565(1):119-125

Subject

Language

ISSN

0168-9002

Online Access

Full Text (ScienceDirect 종량제) Web of Science JCR 저널정보 Scopus Find it@PNU

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