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X-ray topography characterization of gallium nitride substrates for power device development

Document Type

Article

Author

Raghothamachar, Balaji; Liu, Yafei; Peng, Hongyu; Ailihumaer, Tuerxun; Dudley, Michael; Shahedipour-Sandvik, F. Shadi; Jones, Kenneth A.; Armstrong, Andrew; Allerman, Andrew A.; Han, Jung; Fu, Houqiang; Fu, Kai; Zhao, Yuji

Source

In Journal of Crystal Growth 15 August 2020 544

Subject

Language

ISSN

0022-0248

Online Access

Full Text (ScienceDirect 종량제) Web of Science JCR 저널정보 Scopus Find it@PNU

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