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Solid immersion facilitates fluorescence microscopy with nanometer resolution and sub-Ångström emitter localization

Document Type

Article

Author

Wildanger, D.; Schill, H.; Schönle, A.; Hell, S.W.; Patton, B.R.; Marseglia, L.; Hadden, J.P.; Knauer, S.; Rarity, J.G.; O'Brien, J.L.; Smith, J.M.

Source

In: Advanced Materials. (Advanced Materials, 20 November 2012, 24(44):OP309-OP313)

Subject

Language

English

ISSN

09359648
15214095

Online Access

Full Text (Wiley Journals) Full Text (Wiley-DB) Web of Science JCR 저널정보 Scopus Find it@PNU

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