학술논문
Yield degradation mechanisms for two-shock capsules evaluated through simulations
Document Type
Article
Author
Bradley, P.A.; Haines, B.M.; Kyrala, G.A.; Peterson, R.R.; Yi, A.; Yin, L.; Olson, R.E.; Krasheninnikova, N.; Batha, S.H.; Kline, J.L.; Sauppe, J.P.; Finnegan, S.M.; MacLaren, S.A.; Salmonson, J.D.; Pino, J.E.; MacKay, K.K.; Pak, A.; Ma, T.; Dittrich, T.R.; Dewald, E.L.; Khan, S.F.; Sayre, D.; Tommasini, R.; Ralph, J.E.; Field, J.E.; Masse, L.; Tipton, R.E.; MacKinnon, A.J.; Benedetti, L.R.; Nagel, S.R.; Bradley, D.K.; Celliers, P.M.; Berzak Hopkins, L.; Izumi, N.; Kervin, P.; Yeamans, C.; Hatarik, R.; Hartouni, E.P.; Turnbull, D.P.; Chen, K.C.; Hoover, D.E.
Source
In: Physics of Plasmas . (Physics of Plasmas, 1 October 2022, 29(10))
Subject
Language
English
ISSN
10897674
1070664X
1070664X