학술논문
A 10T Soft-Error-Immune SRAM with Multi-Node Upset Recovery for Low-Power Space Applications
Document Type
Article
Author
Source
In: IEEE Transactions on Device and Materials Reliability . (IEEE Transactions on Device and Materials Reliability, 1 March 2022, 22(1):85-88)
Subject
Language
English
ISSN
15582574
15304388
15304388