학술논문
Physics-Based Strategies for Fast TDDB Testing and Lifetime Estimation in SiC Power MOSFETs
Document Type
Article
Author
Source
In: IEEE Transactions on Industrial Electronics . (IEEE Transactions on Industrial Electronics, 1 May 2024, 71(5):5285-5295)
Subject
Language
English
ISSN
15579948
02780046
02780046