학술논문
Radiation tolerance of SiGe BiCMOS monolithic silicon pixel detectors without internal gain layer
Document Type
Article
Author
Milanesio, M.; Paolozzi, L.; Moretti, T.; Cardella, R.; Kugathasan, T.; Martinelli, F.; Picardi, A.; Semendyaev, I.; Zambito, S.; Cadoux, F.; Cardarelli, R.; Débieux, S.; Favre, Y.; Fenoglio, C.A.; Ferrere, D.; Gonzalez-Sevilla, S.; Iodice, L.; Kotitsa, R.; Magliocca, C.; Nessi, M.; Pizarro-Medina, A.; Sabater Iglesias, J.; Saidi, J.; Vicente Barreto Pinto, M.; Iacobucci, G.; Elviretti, M.; Rücker, H.; Nakamura, K.; Takubo, Y.; Togawa, M.
Source
In: Journal of Instrumentation . (Journal of Instrumentation, 1 January 2024, 19(1))
Subject
Language
English
ISSN
17480221