학술논문
Observation of Focused Ion Beam-Induced Artifacts in Transmission Electron Microscopy Samples Leading to the Epitaxial Growth of AlGaSb Quantum Dots on the GaSb Substrate
Document Type
Article
Author
Source
In: Microscopy and Microanalysis . (Microscopy and Microanalysis, 1 February 2023, 29(1):138-144)
Subject
Language
English
ISSN
14358115
14319276
14319276