학술논문
The VERT-X calibration facility: Development of the most critical parts
Document Type
Conference Paper
Author
Moretti, A.; Pareschi, G.; Basso, S.; Spiga, D.; Ghigo, M.; Tagliaferri, G.; Sironi, G.; Civitani, M.; Cotroneo, V.; La Palombara, N.; Uslenghi, M.; Tordi, M.; Delorenzi, S.; Dury, F.; Valsecchi, G.; Zocchi, F.; Marioni, F.; Vernani, D.; Amisano, F.; Parissenti, G.; Parodi, G.; Ottolini, M.; Corradi, P.; Bavdaz, M.; Ferreira, I.
Source
In: Proceedings of SPIE - The International Society for Optical Engineering , Optics for EUV, X-Ray, and Gamma-Ray Astronomy X. (Proceedings of SPIE - The International Society for Optical Engineering, 2021, 11822)
Subject
Language
English
ISSN
1996756X
0277786X
0277786X