학술논문

Development of a Versatile Test Platform for Single Event Effect (SEE) Characterization of Analog, Digital and Mixed-Signals Integrated Circuits (ICs)

Document Type

Periodical

Author

Valsecchi, N.; Gloutnay, E.; Pellerin, T.; Cusson, J.-F.; Lafrance, S.; Hardy, J.; Brassard, G.

Source

IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 56(6):3341-3346 Dec, 2009

Subject

Nuclear Engineering
Bioengineering
Circuit testing
Integrated circuit testing
Mixed analog digital integrated circuits
Electronic equipment testing
Event detection
Single event upset
Data acquisition
Radiation detectors
Costs
Space technology
Environmental testing
integrated circuit (IC) testing
integrated circuit radiation effect
single event effect
test equipment

Language

ISSN

0018-9499
1558-1578

Abstract

This paper describes a versatile test platform developed by the Canadian Space Agency (CSA), relying on a configurable Digital Comparator and Analog Multitrig Unit (DCAMU), aimed at detecting and counting single-event effects (SEEs) for a variety of electronic devices under radiation testing.

Online Access

Full Text (IEEE) Web of Science JCR 저널정보 Scopus Find it@PNU

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