학술논문
Analytical parasitic extraction for fast physical verification of silicon photonics
Document Type
Conference
Source
2016 Photonics North (PN) Photonics North (PN), 2016. :1-2 May, 2016
Subject
Language
Abstract
We present accurate models compared to electromagnetic (EM) solvers for the coupling coefficient of two parallel waveguides and for the bend waveguides loss. These models can be used with any electronic design automation (EDA) tool as the equations depend only on the waveguide dimensions which can be extracted easily from the layout. Hence these models will save a large amount of time.