학술논문

Microwave effective linewidth in amorphous Co-Ta films
Document Type
Periodical
Source
IEEE Transactions on Magnetics IEEE Trans. Magn. Magnetics, IEEE Transactions on. 20(5):1259-1260 Sep, 1984
Subject
Fields, Waves and Electromagnetics
Amorphous materials
Magnetic resonance
Magnetic films
Magnetic field measurement
Scattering
Frequency
Ferrite films
Annealing
Sputtering
Microwave theory and techniques
Language
ISSN
0018-9464
1941-0069
Abstract
The effective linewidth method, originally developed to study microwave losses and micro-structure in ferrites, has been applied to amorphous Co-Ta metallic films for the first time. The effective linewidth spectra reveal the presence of two magnon scattering relaxation processes in these films and are very sensitive to microsctructure changes. The effective linewidth technique can therefore be used to study structural relaxation and recrystallization processes in amorphous alloys.