학술논문

High resolution spectral characterization of Betatron X-ray radiation
Document Type
Conference
Source
2008 Conference on Lasers and Electro-Optics and 2008 Conference on Quantum Electronics and Laser Science Lasers and Electro-Optics, 2008 and 2008 Conference on Quantum Electronics and Laser Science. CLEO/QELS 2008. Conference on. :1-2 May, 2008
Subject
Photonics and Electrooptics
Components, Circuits, Devices and Systems
Electrons
X-ray lasers
Plasma measurements
Plasma properties
Spectroscopy
Plasma sources
Plasma x-ray sources
X-ray imaging
X-ray diffraction
Chemical lasers
Language
Abstract
We present the first detailed spectral measurement of 1-3 keV Betatron X-ray radiation with two high resolution crystal spectrometers. Electron trajectories in the laser produced plasma can be determined with this measurement.