학술논문

High Precision Voltage Measurement System Utilizing Low-End ATE Resource and BOST
Document Type
Conference
Source
2022 IEEE 31st Asian Test Symposium (ATS) ATS Test Symposium (ATS), 2022 IEEE 31st Asian. :37-42 Nov, 2022
Subject
Components, Circuits, Devices and Systems
Computing and Processing
Temperature measurement
Performance evaluation
Temperature sensors
Semiconductor device measurement
Voltage measurement
Costs
Prototypes
ADC
High Resolution
Subranging
Voltage Measurement
Mixed-Signal IC Testing
ATE
BOST
Language
ISSN
2377-5386
Abstract
This paper demonstrates that a 20-bit subrange ADC for high precision voltage measurement can be implemented with standard ATE resource and BOST circuits, without special devices. Our prototype 20-bit ADC employs subranging architecture and consists of a 16bit ADC (LTC1867), a 20-bit DAC (ADC5791), Arduino and some additional circuits. Its operation has been confirmed with simulations and experiments, and effects of non-idealities for each circuit to the overall 20-bit ADC performance have been evaluated. We consider that a 16bit audio-band digitizer in an ATE system can be used as the 16bit ADC while the 20-bit DAC as well as an error amplifier (another component for the subranging ADC) can be implemented with BOST circuits.