학술논문

Optimizing RFSOI Performance through a T-shaped Gate and Nano-Second Laser Annealing Techniques
Document Type
Conference
Source
2023 IEEE Radio Frequency Integrated Circuits Symposium (RFIC) Radio Frequency Integrated Circuits Symposium (RFIC), 2023 IEEE. :61-64 Jun, 2023
Subject
Communication, Networking and Broadcast Technologies
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Fields, Waves and Electromagnetics
Resistance
Radio frequency
Performance evaluation
Temperature measurement
Annealing
Fingers
Lasers
RFSOI
CMOS
HF noise
NLA
T-shaped
Language
ISSN
2375-0995
Abstract
We report on two experiments that were carried out in order to boost the RF performances of PD-SOI devices. In the first experiment we implemented a T-shaped gate on a nominally 40 nm long device to mimic on an advanced RFSOI platform the mushroom gate shape that is usually found in III-V devices. T-shaped gate more than halved the longitudinal gate resistance improving RF figure-of-merits for long finger devices. In a second experiment we used a nano-second laser anneal of the gate poly-Si layer. The reduction of the vertical component of the gate resistance helped to improve the performances of short finger devices.