학술논문

Single event transient characterisation of analog IC's for ESA's satellites
Document Type
Conference
Source
1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) Radiation and its effects on components and systems Radiation and Its Effects on Components and Systems, 1999. RADECS 99. 1999 Fifth European Conference on. :573-581 1999
Subject
Fields, Waves and Electromagnetics
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Nuclear Engineering
Analog integrated circuits
Satellites
Circuit testing
Power supplies
Pulse width modulation
System testing
Proton accelerators
Single event upset
Voltage control
Operational amplifiers
Language
Abstract
The analysis of four self switch-off events in the power supply on-board ESA's SOHO satellite point strongly in the direction of being cosmic ray or proton induced. Detailed analysis of the relevant power supply schematics identified a number of analog IC's capable of causing or contributing to such events. This paper details the effort taken in order to characterise the upset sensitivity of the various analog IC's flown. Testing aspects and Single Event Transient (SET) results are presented. Ground testing, simulating the flight conditions, were carried out at both heavy ion and proton accelerators.