학술논문

Improved reliability of organic light-emitting diodes with indium-zinc-oxide anode contact
Document Type
Conference
Source
2009 IEEE International Reliability Physics Symposium Reliability Physics Symposium, 2009 IEEE International. :105-108 Apr, 2009
Subject
General Topics for Engineers
Organic light emitting diodes
Anodes
Contacts
Indium tin oxide
Thermal resistance
Optical devices
Thermal stresses
Electrical resistance measurement
Electric variables measurement
Electric resistance
OLED
ITO
IZO
lifetime
Language
ISSN
1541-7026
1938-1891
Abstract
With this paper we report a comparison of the performance and reliability of Organic Light-Emitting Diodes (OLEDs) with Indium-Tin Oxide (ITO) and Indium-Zinc Oxide (IZO) anode contact layer. The analysis has been carried out by means of electrical and optical measurements: the devices have been compared in terms of efficiency, thermal resistance and reliability. The results of this analysis indicate that: (i) the use of an IZO anode allows to achieve an efficiency comparable to the case of ITO contacts; (ii) devices with IZO contact have a significantly lower thermal resistance, compared to the ones with ITO anode; (iii) accelerated stress tests show that the OLEDs with IZO anode exhibit an higher reliability. Therefore, the relevant results presented within this work demonstrate that the use of IZO anodes guarantees OLED performance comparable with commercial ITO anodes, and allows a better heat dissipation and devices reliability.