학술논문

Characterization and Modeling of Reduced-Graphene Oxide Ambipolar Thin-Film Transistors
Document Type
Periodical
Source
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(6):3192-3198 Jun, 2022
Subject
Components, Circuits, Devices and Systems
Engineered Materials, Dielectrics and Plasmas
Transistors
Electrodes
Thin film transistors
Logic gates
Graphene
Electric potential
Capacitance
Ambipolar transistors
liquid-gated transistors
reduced graphene oxide (rGO)
thin-film transistors (TFTs)
Language
ISSN
0018-9383
1557-9646
Abstract
The rise of graphene as an innovative electronic material promoted the study and development of new 2-D materials. Among them, reduced graphene oxide (rGO) appears like an easy and cost-effective solution for the fabrication of thin-film transistors (TFTs). To understand the limits and possible application fields of rGO-based TFTs, a proper estimation of the device parameters is of extreme importance. In this work, liquid-gated ambipolar rGO-TFTs are characterized and a description of their working principle is given. Particular attention is paid toward the importance of the transistors’ OFF-state conductivity that was modeled as a resistance connected in parallel with the TFT. Thanks to this model, the main transistor parameters were extrapolated from rGO-TFTs with different levels of electrochemical reduction. The extracted parameters allowed understanding that rGO-TFTs have similar holes and electrons mobilities, and the more pronounced p-type behavior of the devices is due to a positive shift in the p-type and n-type threshold voltages.