학술논문
A test scheme for time-sensitive network switch in intelligent substation
Document Type
Conference
Author
Source
2024 IEEE 7th Advanced Information Technology, Electronic and Automation Control Conference (IAEAC) Advanced Information Technology, Electronic and Automation Control Conference (IAEAC), 2024 IEEE 7th. 7:294-297 Mar, 2024
Subject
Language
ISSN
2689-6621
Abstract
With the wide application of TSN technology in smart substations, it is necessary to study the test technology of power time-sensitive network switches in terms of performance, function, security and reliability. Based on the principle and mechanism specified in TSN series standards, this paper proposes a test and verification scheme for performance, function, security and reliability. It is verified that the test scheme proposed in this paper can effectively achieve the test goal, which has reference significance for the development and testing of TSN network equipment.