학술논문
OXFORD INSTRUMENTS INTRODUCES GETSTARTED FEATURE.
Document Type
Article
Author
Source
Subject
*ATOMIC force microscopy
*CANTILEVERS
*IMAGING systems
*
*
Language
ISSN
1537-0755
Abstract
The article reports on the launch of GetStarted feature by research tool maker Oxford Instruments making the use of atomic force microscopy (AFM) simpler. Topics discussed include obtaining high quality data using GetStarted by Oxford Instruments' Asylum Research , use of Tapping mode as an AFM imaging mode, and high-speed imaging by AFM imaging mode when combined with small cantilevers.