학술논문
Optical and structural studies of films grown thermally on zirconium surfaces.
Document Type
Article
Source
Subject
*THIN films
*ZIRCONIUM
*INFRARED spectroscopy
*ATOMIC force microscopy
*GEOMETRIC surfaces
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Language
ISSN
0021-8979
Abstract
Variable angle IR reflection spectroscopy and atomic force microscopy are used to determine the thickness and morphology of films grown thermally on Zr surfaces in air. The density and homogeneity of these films increases with temperature in the range studied (773-873 K) and growth at the highest temperature follows cubic rate law kinetics. We demonstrate a structure-property relationship for these thermally grown films and suggest the application of IR reflectivity as an inspection method during the growth of environmentally passive films on industrial Zr components. [ABSTRACT FROM AUTHOR]