학술논문
ID20 – opportunities for inelastic X-ray scattering at extreme conditions.
Document Type
Article
Author
Source
Subject
*HIGH pressure (Science)
*INELASTIC scattering
*X-ray absorption
*ATOMIC structure
*ELECTRONIC structure
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Language
ISSN
0895-7959
Abstract
Owing to the availability of bright X-rays sources such as the ESRF-EBS, inelastic X-ray scattering of samples contained in complex sample environments, including high pressure devices, has become feasible. Compared to well-established characterization techniques such as X-ray diffraction or X-ray absorption fine structure spectroscopy, inelastic X-ray scattering of samples under extreme conditions is a relatively novel probe. However, unique information about the electronic, magnetic, and local atomic structure is accessible with inelastic X-ray scattering. Here, capabilities of beamline ID20 of the ESRF in the field of high pressure inelastic X-ray scattering are presented and some recent activities are reviewed. [ABSTRACT FROM AUTHOR]