학술논문
Generation-recombination noise in submicron semiconductor layers: Influence of the edges.
Document Type
Article
Author
Source
Subject
*SEMICONDUCTORS
*ELECTRON distribution
*EQUATIONS
*
*
Language
ISSN
0021-8979
Abstract
Presents a theoretical analysis of thin semiconductor layers. Information on the spatial cross-correlation spectral density of electron density; Energy band diagram of semiconductor layers; Equations used in the study.