학술논문
Single crystal growth and structural characterization of Cr doped Sb1.95Cr0.05Te3 single crystal.
Document Type
Article
Source
Subject
*CRYSTAL growth
*SINGLE crystals
*ENERGY dispersive X-ray spectroscopy
*RIETVELD refinement
*X-ray diffraction
*CHROMIUM
*DOPING agents (Chemistry)
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Language
ISSN
0094-243X
Abstract
We report the high quality single crystal growth and X-ray diffraction characterization studies of bulk Sb1.95Cr0.05Te3 single crystals. Elemental analysis is confirmed by TEM EDX spectroscopy. Single crystal of Sb1.95Cr0.05Te3 is grown by modified Bridgman method. The diffraction peaks corresponding to {0, 0, 3} planes reveal the growth of crystal along the c-direction. X-ray diffraction analysis using Rietveld refinement verifies the phase purity and confirms that the material crystalizes in a trigonal structure with R- 3m space group. [ABSTRACT FROM AUTHOR]