소장자료
LDR | 04723cam a2200289 a 4500 | ||
001 | 0093802959▲ | ||
005 | 20180519072224▲ | ||
008 | 101013s2011 nyua b 001 0 eng c▲ | ||
010 | ▼a2010040873▲ | ||
020 | ▼a9780071753791 (hbk.)▲ | ||
035 | ▼a(KERIS)REF000016102457▲ | ||
040 | ▼aDLC▼cDLC▼dDLC▼d221016▲ | ||
042 | ▼apcc▲ | ||
050 | 0 | 0 | ▼aTK7874.53▼b.L38 2011▲ |
082 | 0 | 0 | ▼a621.381/046▼223▲ |
090 | ▼a621.381046▼bL366r▲ | ||
100 | 1 | ▼aLau, John H.▲ | |
245 | 1 | 0 | ▼aReliability of RoHS-Compliant 2D and 3D IC interconnects /▼cJohn Lau.▲ |
260 | ▼aNew York, NY :▼bMcGraw-Hill Professional,▼cc2011.▲ | ||
300 | ▼axxix, 606 p. :▼bill. (some col.) ;▼c24 cm.▲ | ||
504 | ▼aIncludes bibliographical references and index.▲ | ||
505 | 0 | ▼aCh 1. Introduction to RoHS Compliant Semiconductor and Packaging Technologies -- Ch 2. Reliability Engineering of Lead-Free Interconnects -- Ch 3. Notes on Failure Criterion -- Ch 4. Reliability of 1657-Pin CCGA Lead-Free Solder Joints -- Ch 5. Reliability of PBGA (w/o Underfils) Lead-Free Solder Joints -- Ch 6. Reliability of LED Lead-Free Interconnects -- Ch 7. Reliability of VCSEL Lead-Free Interconnects -- Ch 8. Reliability of Low-Temperature Lead-Free (SnBiAg) Solder Joints -- Ch 9. Reliability of Lead-Free (SACX) Solder Joints -- Ch 10. Chip-to-Wafer (C2W) Lead-Free Interconnect Reliability -- Ch 11. Wafer-to-Wafer (W2W) Lead-Free Interconnect Reliability -- Ch 12. Through-Silicon-Via (TSV) Interposer Lead-Free Interconnect Reliability -- Ch 13. Electromigration of Lead-Free Microbumps for 3D IC Integrations -- Ch 14. Effects of Dwell-Time and Ramp-Rates on SAC Thermal Cycling Test Results -- Ch 15. Effects of High Strain Rate (Impact) on SAC Solder Bumps -- Ch 16. Effects of Voids on Solder Joints Reliability.▲ | |
520 | ▼a"Unique global coverage of RoHS-compliant materials for electronics manufacturing and for packaging assembly and semiconductor integration Reliability of RoHS-Compliant 2D and 3D IC Interconnects provides comprehensive details on RoHS-compliant electronics packaging solder interconnects. This authoritative guide aids in developing innovative, high-performance, cost-effective, and reliable lead-free interconnects for electronics and optoelectronic products. Reliability of RoHS-Compliant 2D and 3D IC Interconnects Covers chip-level interconnect reliability, first- and second-level interconnect reliability, and 3D IC integration interconnect reliability Addresses challenging problems created by increasing interest in lead-free interconnect reliability of 3D packaging and 3D IC integration Provides information fundamental to research and development of design (mechanical, optical, electrical, and thermal); materials; process; manufacturing; testing; and reliability for lead-free interconnects in RoHS-compliant electronics products Removes road blocks to, avoids unnecessary false starts in, and accelerates design, materials, and process development in packaging technology In-depth details: Introduction to RoHS Compliant Semiconductor and Packaging Technologies; Reliability Engineering of Lead-Free Interconnects; Notes on Failure Criterion; Reliability of 1657-Pin CCGA Lead-Free Solder Joints; Reliability of PBGA Lead-Free Solder Joints; Reliability of LED Lead-Free Interconnects; Reliability of VCSEL Lead-Free Interconnects; Reliability of Low-Temperature Lead-Free (SnBiAg) Solder Joints; Reliability of Lead-Free (SACX) Solder Joints; Chip-to-Wafer (C2W) Lead-Free Interconnect Reliability; Wafer-to-Wafer (W2W) Lead-Free Interconnect Reliability; Through-Silicon-Via (TSV) Interposer Lead-Free Interconnect Reliability; Electromigration of Lead-Free Microbumps for 3D IC Integrations; Effects of Dwell-Time and Ramp-Rates on SAC Thermal Cycling Test Results; Effects of High Strain Rate (Impact) on SAC Solder Bumps; Effects of Voids on Solder Joints Reliability"--Provided by publisher.▲ | ||
520 | ▼a"Reliability of RoHS-Compliant 2D and 3D IC Interconnects provides comprehensive coverage of RoHS-compliant electronics packaging solder interconnects. RoHS--the restriction of the use of certain hazardous substances in electrical and electronic equipment--is law in the EU, China, Japan, Korea, Canada, Australia, California, etc. RoHS bans lead and five other materials; thus, in order to ship electrical products to these regions and countries, products must be lead-free. The material in this book aids in developing innovative, high-performance, cost-effective, and reliable lead-free interconnects for electronics and optoelectronic products"--Provided by publisher.▲ | ||
650 | 0 | ▼aInterconnects (Integrated circuit technology)▼xReliability.▲ | |
650 | 0 | ▼aGreen technology▼xReliability.▲ | |
999 | ▼a경동욱▼c김미선▲ |

Reliability of RoHS-Compliant 2D and 3D IC interconnects
자료유형
국외단행본
서명/책임사항
Reliability of RoHS-Compliant 2D and 3D IC interconnects / John Lau.
개인저자
발행사항
New York, NY : McGraw-Hill Professional , c2011.
형태사항
xxix, 606 p. : ill. (some col.) ; 24 cm.
서지주기
Includes bibliographical references and index.
내용주기
Ch 1. Introduction to RoHS Compliant Semiconductor and Packaging Technologies -- Ch 2. Reliability Engineering of Lead-Free Interconnects -- Ch 3. Notes on Failure Criterion -- Ch 4. Reliability of 1657-Pin CCGA Lead-Free Solder Joints -- Ch 5. Reliability of PBGA (w/o Underfils) Lead-Free Solder Joints -- Ch 6. Reliability of LED Lead-Free Interconnects -- Ch 7. Reliability of VCSEL Lead-Free Interconnects -- Ch 8. Reliability of Low-Temperature Lead-Free (SnBiAg) Solder Joints -- Ch 9. Reliability of Lead-Free (SACX) Solder Joints -- Ch 10. Chip-to-Wafer (C2W) Lead-Free Interconnect Reliability -- Ch 11. Wafer-to-Wafer (W2W) Lead-Free Interconnect Reliability -- Ch 12. Through-Silicon-Via (TSV) Interposer Lead-Free Interconnect Reliability -- Ch 13. Electromigration of Lead-Free Microbumps for 3D IC Integrations -- Ch 14. Effects of Dwell-Time and Ramp-Rates on SAC Thermal Cycling Test Results -- Ch 15. Effects of High Strain Rate (Impact) on SAC Solder Bumps -- Ch 16. Effects of Voids on Solder Joints Reliability.
요약주기
"Unique global coverage of RoHS-compliant materials for electronics manufacturing and for packaging assembly and semiconductor integration Reliability of RoHS-Compliant 2D and 3D IC Interconnects provides comprehensive details on RoHS-compliant electronics packaging solder interconnects. This authoritative guide aids in developing innovative, high-performance, cost-effective, and reliable lead-free interconnects for electronics and optoelectronic products. Reliability of RoHS-Compliant 2D and 3D IC Interconnects Covers chip-level interconnect reliability, first- and second-level interconnect reliability, and 3D IC integration interconnect reliability Addresses challenging problems created by increasing interest in lead-free interconnect reliability of 3D packaging and 3D IC integration Provides information fundamental to research and development of design (mechanical, optical, electrical, and thermal); materials; process; manufacturing; testing; and reliability for lead-free interconnects in RoHS-compliant electronics products Removes road blocks to, avoids unnecessary false starts in, and accelerates design, materials, and process development in packaging technology In-depth details: Introduction to RoHS Compliant Semiconductor and Packaging Technologies; Reliability Engineering of Lead-Free Interconnects; Notes on Failure Criterion; Reliability of 1657-Pin CCGA Lead-Free Solder Joints; Reliability of PBGA Lead-Free Solder Joints; Reliability of LED Lead-Free Interconnects; Reliability of VCSEL Lead-Free Interconnects; Reliability of Low-Temperature Lead-Free (SnBiAg) Solder Joints; Reliability of Lead-Free (SACX) Solder Joints; Chip-to-Wafer (C2W) Lead-Free Interconnect Reliability; Wafer-to-Wafer (W2W) Lead-Free Interconnect Reliability; Through-Silicon-Via (TSV) Interposer Lead-Free Interconnect Reliability; Electromigration of Lead-Free Microbumps for 3D IC Integrations; Effects of Dwell-Time and Ramp-Rates on SAC Thermal Cycling Test Results; Effects of High Strain Rate (Impact) on SAC Solder Bumps; Effects of Voids on Solder Joints Reliability"--Provided by publisher./"Reliability of RoHS-Compliant 2D and 3D IC Interconnects provides comprehensive coverage of RoHS-compliant electronics packaging solder interconnects. RoHS--the restriction of the use of certain hazardous substances in electrical and electronic equipment--is law in the EU, China, Japan, Korea, Canada, Australia, California, etc. RoHS bans lead and five other materials; thus, in order to ship electrical products to these regions and countries, products must be lead-free. The material in this book aids in developing innovative, high-performance, cost-effective, and reliable lead-free interconnects for electronics and optoelectronic products"--Provided by publisher./
ISBN
9780071753791 (hbk.)
청구기호
621.381046 L366r
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