학술논문
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Conference
Bao, R.; Qin, L.; Frougier, J.; Suk, S.; Rabie, M.; Bajpai, U.; Chou, A.; Nechay, B.; Mohamed, M.; Pujari, R.; Weir, T. J; Harmon, K.; Varma, A.; Armstrong-Moore, W.; Cestero, A.; Emans, S.; Hundekar, P.; Joshi, R.; Li, J.; Liu, X.; Lucarini, S.; Radens, C.; Siddiqui, S.; Trombley, H.; Bryant, A.; Hasanuzzaman, M.; Majumdar, A.; Sung, M.; Zhang, J.; Leobandung, E.
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Academic Journal
In: International Journal of Drug Policy . (International Journal of Drug Policy, 2024)
Conference
Lee, Y. M.; Na, M. H.; Chu, A.; Young, A.; Hook, T.; Liebmann, L.; Nowak, E. J.; Baek, S. H.; Sengupta, R.; Trombley, H.; Miao, X.
2017 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2017 IEEE International. :29.3.1-29.3.4 Dec, 2017
Academic Journal
Deng, J.; Rahman, A.; Thoma, R.; Schneider, P.W.; Johnson, J.; Trombley, H.; Lu, N.; Williams, R.Q.; Nayfeh, H.M.; Zhao, K.; Robison, R.; Guan, X.; Zamdmer, N.; Shuma, S.; Worth, B.; Sundquist, J.E.; Foreman, E.A.; Springer, S.K.; Wachnik, R.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 62(6):1760-1768 Jun, 2015
Conference
Yu, X.; Gluschenkov, O.; Zamdmer, N. D.; Deng, J.; Goplen, B. A.; Landis, H. S.; Logan, L. R.; Culp, J. A.; Liang, Y.; Cai, M.; Lee, W.; Rovedo, N.; Tamweber, F. D.; Lea, D. M.; Greene, B. J.; Sim, J.; Slisher, D. K.; Chou, A. I.; Chang, P.; Trombley, H.; Nowak, E. J.; Deshpande, S. V; Henson, W. K.; Mocuta, A. C.; Rim, K.
2011 International Electron Devices Meeting Electron Devices Meeting (IEDM), 2011 IEEE International. :25.3.1-25.3.4 Dec, 2011
Conference
IEEE/SEMI 1998 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop (Cat. No.98CH36168) Semiconductor manufacturing Advanced Semiconductor Manufacturing Conference and Workshop, 1998. 1998 IEEE/SEMI. :332 1998
Academic Journal
In: Microelectronics Reliability . (Microelectronics Reliability, August 2012, 52(8):1571-1574)
Conference
Gambino, J.; Stamper, T.; Trombley, H.; Luce, S.; Allen, F.; Weinstein, C.; Reuter, B.; Dunbar, M.; Samek, V.; McLaughlin, P.; Kane, T.
MRS Online Proceedings Library; 2003, Vol. 766 Issue 1, p1-6, 6p
Conference
Lee, Y.M.; Na, M.H.; Chu, A.; Young, A.; Hook, T.; Trombley, H.; Miao, X.; Baek, S.H.; Sengupta, R.; Liebmann, L.; Nowak, E.J.
In: Technical Digest - International Electron Devices Meeting, IEDM , 2017 IEEE International Electron Devices Meeting, IEDM 2017. (Technical Digest - International Electron Devices Meeting, IEDM, 23 January 2018, :29.3.1-29.3.4)
Conference
In: Technical Proceedings of the 2012 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2012 , Nanotechnology 2012: Electronics, Devices, Fabrication, MEMS, Fluidics and Computational - 2012 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2012. (Technical Proceedings of the 2012 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2012, 2012, :826-828)
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[AR] Trombley, H.
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