학술논문
'학술논문'
에서 검색결과 15건 | 목록
1~10
Conference
Bao, R.; Qin, L.; Frougier, J.; Suk, S.; Rabie, M.; Bajpai, U.; Chou, A.; Nechay, B.; Mohamed, M.; Pujari, R.; Weir, T. J; Harmon, K.; Varma, A.; Armstrong-Moore, W.; Cestero, A.; Emans, S.; Hundekar, P.; Joshi, R.; Li, J.; Liu, X.; Lucarini, S.; Radens, C.; Siddiqui, S.; Trombley, H.; Bryant, A.; Hasanuzzaman, M.; Majumdar, A.; Sung, M.; Zhang, J.; Leobandung, E.
2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Academic Journal
Cedillo, L.; Ahsan, F.M.; Li, S.; Zhou, Y.; Zhang, Y.; Adedoja, A.; Murphy, L.M.; Yerevanian, A.; Emans, S.; Soukas, A.A.; Stuhr, N.L.; Curran, S.P.; Dao, K.; Watrous, J.; Jain, M.; Li, Z.; Das, S.; Peterson, N.D.; Pukkila-Worley, R.
In: eLife . (eLife, 2023, 12)
Academic Journal
Yerevanian, A.; Murphy, L.M.; Emans, S.; Zhou, Y.; Ahsan, F.M.; Baker, D.; Li, S.; Adedoja, A.; Cedillo, L.; Soukas, A.A.; Stuhr, N.L.; Curran, S.P.; Gnanatheepam, E.; Georgakoudi, I.; Dao, K.; Jain, M.
In: Aging Cell . (Aging Cell, November 2022, 21(11))
Academic Journal
Blood, Emily; Trent, Maria; Gordon, Catherine; Goncalves, Adrianne; Resnick, Michael; Fortenberry, J.; Boyer, Cherrie; Richardson, Laura; Emans, S.
Conference
In: ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings , 2023 34th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2023. (ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings, 2023, 2023-May)
Conference
Kagalwala, T.; Timoney, P.; Fiege, R.; Emans, J.; Hughes, T.; Elia, A.; Vaid, A.; Emans, S.; Vilge, B.; Cheng, M.; Kang, C.; Zingerman, D.; Drayton, K.; Yellai, N.; Sendelbach, M.
In: ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings , 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference, ASMC 2019. (ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings, May 2019, 2019-May)
Academic Journal
In: Journal of Pediatrics . (Journal of Pediatrics, 1994, 125(1):153-160)
Conference
Breton, M.; Chao, R.; Muthinti, G.R.; De La Peña, A.A.; Simon, J.; Gaudiello, J.; Hao, T.; Cepler, A.J.; Sendelbach, M.; Emans, S.; Shifrin, M.; Etzioni, Y.; Urenski, R.; Lee, W.T.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXXI. (Proceedings of SPIE - The International Society for Optical Engineering, 2017, 10145)
Conference
Muthinti, G.R.; Loubet, N.; Chao, R.; De La Peña, A.A.; Li, J.; Guillorn, M.A.; Yamashita, T.; Kanakasabapathy, S.; Gaudiello, J.; Cepler, A.J.; Sendelbach, M.; Emans, S.; Wolfling, S.; Ger, A.; Kandel, D.; Koret, R.; Lee, W.T.; Gin, P.; Matney, K.; Wormington, M.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXXI. (Proceedings of SPIE - The International Society for Optical Engineering, 2017, 10145)
Conference
Bozdog, C.; Kim, H.K.; Emans, S.; Sherman, B.; Turovets, I.; Urensky, R.; Brill, B.; Vaid, A.; Sendelbach, M.
In: Proceedings of SPIE - The International Society for Optical Engineering , Metrology, Inspection, and Process Control for Microlithography XXV. (Proceedings of SPIE - The International Society for Optical Engineering, 2011, 7971)
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[AR] Emans, S.
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