학술논문
'학술논문'
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1~10
Academic Journal
Doevenspeck, J.; Degraeve, R.; Fantini, A.; Cosemans, S.; Mallik, A.; Debacker, P.; Verkest, D.; Lauwereins, R.; Dehaene, W.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(5):2301-2305 May, 2021
Academic Journal
Saito, D.; Doevenspeck, J.; Cosemans, S.; Oh, H.; Perumkunnil, M.; Papistas, I.A.; Belmonte, A.; Rassoul, N.; Delhougne, R.; Kar, G.; Debacker, P.; Mallik, A.; Verkest, D.; Na, M.H.
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(11):4616-4620 Nov, 2020
Conference
2019 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2019 IEEE International. :1-6 Mar, 2019
Academic Journal
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(2):505-511 Feb, 2020
Conference
Doevenspeck, J.; Garello, K.; Rao, S.; Yasin, F.; Couet, S.; Jayakumar, G.; Mallik, A.; Cosemans, S.; Debacker, P.; Verkest, D.; Lauwereins, R.; Dehaene, W.; Kar, G.S.
2021 Symposium on VLSI Technology VLSI Technology, 2021 Symposium on. :1-2 Jun, 2021
Conference
Degraeve, R.; Mallik, A.; Garbin, D.; Doevenspeck, J.; Fantini, A.; Rodopoulos, D.; Roussel, Ph.; Govoreanu, B.; Hendrickx, P.; Di Piazza, L.; Stuijt, J.; Schaafsma, S.; Debacker, P.; Donadio, G.; Hody, H.; Goux, L.; Kar, G. S.; Furnemont, A.; Mocut, A.; Verkest, D.
2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2018 IEEE International Symposium on the. :1-5 Jul, 2018
Academic Journal
In: Food and Chemical Toxicology . (Food and Chemical Toxicology, February 2023, 172)
Academic Journal
In: Food Chemistry . (Food Chemistry, 1 January 2023, 398)
Conference
Doevenspeck, J.; Garello, K.; Verhoef, B.; Degraeve, R.; Van Beek, S.; Crotti, D.; Yasin, F.; Couet, S.; Jayakumar, G.; Papistas, I. A; Debacker, P.; Lauwereins, R.; Dehaene, W.; Kar, G. S.; Cosemans, S.; Mallik, A.; Verkest, D.
2020 IEEE Symposium on VLSI Technology VLSI Technology, 2020 IEEE Symposium on. :1-2 Jun, 2020
Academic Journal
Kim, Y.; Gokmen, T.; Miyazoe, H.; Solomon, P.; Kim, S.; Ray, A.; Doevenspeck, J.; Khan, R.S.; Narayanan, V.; Ando, T.
In: Frontiers in Nanotechnology . (Frontiers in Nanotechnology, 31 October 2022, 4)
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[AR] Doevenspeck, J.
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