학술논문
Analysis of Dynamic Impedance for Different Phases of Pseudospark-Driven Electron Beam
Document Type
Periodical
Author
Source
IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(11):5916-5920 Nov, 2023
Subject
Language
ISSN
0018-9383
1557-9646
1557-9646
Abstract
In this article, the dynamic impedance of a pseudospark (PS)-driven electron beam has been analyzed for different phases of breakdown over a range of applied gap voltage (AGV). The electron beam is generated through a PS mechanism device, which consists of a hollow cathode, an interelectrode three-gap structure with two floating anodes, and one anode disk. The developed device has been operated in the self-breakdown mode for AGV ranging from 10 to 30 kV. The electron beam source (EBS) has been characterized and analyzed in terms of its V – I characteristics, impedance during different phases, relative impedance during breakdown under different gap voltages, gap capacitance, inductance, and resistance.