학술논문
Characterization and Modeling of the Susceptibility of Integrated Circuits to Conducted Electromagnetic Disturbances Up to 1 GHz
Document Type
Periodical
Author
Source
IEEE Transactions on Electromagnetic Compatibility IEEE Trans. Electromagn. Compat. Electromagnetic Compatibility, IEEE Transactions on. 50(2):285-293 May, 2008
Subject
Language
ISSN
0018-9375
1558-187X
1558-187X
Abstract
This paper deals with the characterization, as well as the modeling, of the susceptibility of integrated circuits (ICs) to conducted electromagnetic disturbances such as a continuous-wave disturbance. Based on accurate measurement results, a robust mathematical model to predict the susceptibility of a CMOS inverter is developed. This model is based on a neural network approach and is validated up to 1 GHz for different test criteria. A good agreement between measurements and simulated results is reported. The mathematical model is implemented in a software tool such as Advanced Design System in order to facilitate its operation in the evaluation of the susceptibility of ICs.