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An advanced Bragg diffraction imaging technique to characterize defects: The examples of GaN and AlN
Academic Journal
In Microelectronic Engineering 1 May 2023 276
Academic Journal
Lebedev, Vadim; Kustermann, Jan; Engels, Jan; Weippert, Jürgen; Cimalla, Volker; Knittel, Peter; Kirste, Lutz; Giese, Christian; Quellmalz, Patricia; Graff, Andreas; Jeske, Jan
Academic Journal
Academic Journal
Sundarapandian, Balasubramanian; Yassine, Ali; Kirste, Lutz; Baeumler, Martina; Straňák, Patrik; Fisslthaler, Evelin; Prescher, Mario; Yassine, Mohamed; Nair, Akash; Raghuwanshi, Mohit; Ambacher, Oliver
Report
Wolff, Niklas; Schoenweger, Georg; Streicher, Isabel; Islam, Md Redwanul; Braun, Nils; Stranak, Patrik; Kirste, Lutz; Prescher, Mario; Lotnyk, Andriy; Kohlstedt, Hermann; Leone, Stefano; Kienle, Lorenz; Fichtner, Simon
Adv. Physics Res. 2024, 2300113
Academic Journal
In Superlattices and Microstructures September 2020 145
Academic Journal
Leone, Stefano; Fornari, Roberto; Bosi, Matteo; Montedoro, Vincenzo; Kirste, Lutz; Doering, Philipp; Benkhelifa, Fouad; Prescher, Mario; Manz, Christian; Polyakov, Vladimir; Ambacher, Oliver
In Journal of Crystal Growth 15 March 2020 534
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[AR] Kirste, Lutz
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